Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-13T07:12:01.684Z Has data issue: false hasContentIssue false

Heteroepitaxial growth of C60 on tetracene single crystal

Published online by Cambridge University Press:  12 February 2013

Tetsuhiko Miyadera*
Affiliation:
Japan Science and Technology Agency, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Hiroki Mitsuta
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan Graduate School of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
Noboru Ohashi
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Tetsuya Taima
Affiliation:
Japan Science and Technology Agency, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan Research Center of Sustainable Energy and Technology, Kanazawa University, Kakuma, Kanazawa, Japan
Ying Zhou
Affiliation:
Research Center of Sustainable Energy and Technology, Kanazawa University, Kakuma, Kanazawa, Japan
Toshihiro Yamanari
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Yuji Yoshida
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Get access

Abstract

We have developed a method for epitaxial growth of C60 thin films on tetracene single crystals. The crystal orientation of the C60 film was examined by reflection high energy electron diffraction (RHEED) and X-ray diffraction (XRD). In-situ observation by RHEED revealed that the C60 crystallizes from the very initial stage of the deposition (0.1 nm). A 6-fold symmetric pattern, which was observed in a XRD polar scan, can be taken as direct evidence for the epitaxial growth of C60 commensurate with the tetracene (001) surface lattice.

Type
Articles
Copyright
Copyright © Materials Research Society 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Najafov, H., Lee, B., Zhou, Q., Feldman, L. C., and Podzorov, V., Nat. Mat., 2010, 9, 938.CrossRefGoogle Scholar
Lunt, R. R., Benziger, J. B., Forrest, S. R., Adv. Mat., 2010, 22, 1233.CrossRefGoogle Scholar
Yu, B., Huang, L., Wang, H., Yan, D., Adv. Mat., 2010, 22, 1017.CrossRefGoogle Scholar
Zhang, Y., Dong, H., Tang, Q., Ferdous, S., Liu, F., Mannsfeld, S. C. B., Hu, W., Briseno, A. L., J. Am. Chem. Soc., 2010, 132, 11580.CrossRefGoogle Scholar
Peumans, P., Yakimov, A., Forrest, S. R., J. Appl. Phys. 2003, 93, 3693.CrossRefGoogle Scholar
Hiramoto, M., Fujiwara, H., and Yokoyama, M., Appl. Phys. Lett., 1991, 58, 1062.CrossRefGoogle Scholar
Tress, W., Leo, K., and Riede, M., Adv. Func. Mat., 2011, 21, 2140.CrossRefGoogle Scholar
Sundar, V. C., Zaumseil, J., Podzorov, V., Menard, E., Willett, R. L., Someya, T., Gershenson, M. E., and Rogers, J. A., Science, 2004, 303, 1644.CrossRefGoogle Scholar
Miyadera, T., Ohashi, N., Taima, T., Yamanari, T., , Y. and Yoshida, , 2011 MRS Fall Meeting Proceedings, 2012, 1390 mrsf11-1390-h08-10.CrossRefGoogle Scholar
Koma, A., Prog. Cryst. Growth and Charact., 1995, 30, 129.CrossRefGoogle Scholar
Morita, T., Tada, H., and Koma, A., J. Appl. Phys., 1993, 73, 2207.CrossRefGoogle Scholar
Zhang, Y., Dong, H., Tang, Q., Ferdous, S., Liu, F., Mannsfeld, S. C. B., Hu, W., and Briseno, A. L. J. Am Chem. Soc., 2010, 132, 11580.CrossRefGoogle Scholar
Itaka, K., Yamashiro, M., Yamaguchi, J., Haemori, M., Yaginuma, S., Matsumoto, Y., Kondo, M., and Koinuma, H., Adv. Mat., 2006, 18, 1713.CrossRefGoogle Scholar
Yu, B., Huang, L., Wang, H., and Yan, D., Adv. Mat., 2010, 22, 1017.CrossRefGoogle Scholar
Holmes, D., Kumaraswamy, S., Matzger, A. J., and Vollhardt, K. P. C., Chem. Eur. J, 1999, 5, 3399.3.0.CO;2-V>CrossRefGoogle Scholar
David, W. I. F., Ibberson, R. M., and Matsuo, T., Proc. R. Soc. Lond. A, 1993, 442, 129.CrossRefGoogle Scholar