Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-27T18:07:42.923Z Has data issue: false hasContentIssue false

Hetero-Epitaxial Growth of High-TC Superconducting YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox. Multilayer Structures on Ysz Substrates

Published online by Cambridge University Press:  25 February 2011

J. Gao
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
W.A.M. Aarnink
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
W. Coene
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
G.J. Gerritsma
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
M.A.M. Gus
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
F. Hakkens
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
E.M.C.M. Reuvekamp
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
H. Rogalla
Affiliation:
University Twente, Department of Applied Physics, Low Temperature Division, p.O. Box 217, 7500 AE Enschede, The Netherlands
Get access

Abstract

Heteroepitaxial multilayers of YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox have been made by sputtering. Typical thicknesses of the individual layers are of the order of 50 nm. No degradation of the transition temperature and the critical current density due to the presence of the PrBa2Cu3Ox layer could be observed. By using High Resolution Transmission Electron Microscopy the atomic details of the interfaces and the defect structures have been studied. These films showed a perfectly stacked lattice just above the interface between film and substrate. The orientation of the c-axis perpendicular to the substrate was fairly perfect. The structural faults are mainly distributed in the middle and overlying layers. The dominant defects in our films seems to be stacking faults which give rise to nano-sized coherent anti-phase domains with the 1-2-3 structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1]Poppe, U., Prieto, P., Schubert, J., Soltner, H., Urban, K., and Buchal, C., Solid State Common. 71, 569, (1989).Google Scholar
[2]Gao, J., Aarnink, W.A.M., Gerritsma, G.J., Rogalla, H., Physica C 171, 126, (1990).CrossRefGoogle Scholar
[3]Gao, J., Aarnink, W.A.M., Gerritsma, G.J., Veldhuis, D., Rogalla, H., Proc. ASC '1990, IEEE Trans. Magn. 27 (2), (1991).Google Scholar
[4]Gao, J., Häuser, B., and Rogalla, H., J. Appl. Phys. 67, 2512, (1990).Google Scholar
[5]Gao, J., Aarnink, W.A.M., Gerritsma, G.J., Rogalla, H., Appl. Surface Science 46, 74, (1990).Google Scholar
[6]Streiffer, S.K., Eom, C.B., Bravman, J.C., Geballe, T.H., Proceedings of the XHth International Congress for Electron Microscopy (Seattle, U.S.A), 1990, Vol. 4, 6.Google Scholar
[7]Marshall, A.F., Barton, R.W., Char, K., Kapitulnik, A., Oh, B., and Hammond, R.H., Phys. Rev. B 37, 9353, (1988).Google Scholar
[8]Char, K., Lee, M., Barton, R.W., Marshall, A.F., Bozovic, I., Hammond, R.H., Beasley, M.R., Geballe, T.H., and Kapitulnik, A., Phys. Rev. B 38, 834, (1988).Google Scholar
[9]Morris, D.E., Nickel, J.H., Fayn, B., Markelz, A.G., Gronsky, R., Fendorf, M., and Burmester, C.P., (Mater. Res. Soc. Symp. Proc. 169, Pittsburg, PA 1990).Google Scholar
[10]Jin, S., Tiefel, T.H., Nakahara, S., Garebner, J.E., O'Bryan, H.M., Fastnacht, R.A., and Kammlott, G.W., preprint.Google Scholar
[11]Gao, J., Aarnink, W.A.M., Gerritsma, G.J., Rijnders, A.J.H.M., Rogalla, H., Hakkens, F., Coene, W., Gijs, M.A.M., to be published in Physica C, 1991.Google Scholar
[12]Aarnink, W.A.M., Silfhout, A. van, Rogalla, H., to be presented at MRS Spring Meeting symposium C, 1991.Google Scholar
[13]Cava, R.J. et al. , Phys. Rev. B. 36, 5719, (1987).Google Scholar