Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-18T03:19:00.497Z Has data issue: false hasContentIssue false
  • English
  • Français

Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes

Published online by Cambridge University Press:  21 March 2011

P. Moeck ,
W. Qin  and
P. B. Fraundorf
P. Moeck
Affiliation:
Department of Physics, Portland State University, P.O. Box 751, Portland, OR 97207-0751, pmoeck@pdx.edu
W. Qin
Affiliation:
Motorola Technology Solutions/SPS, MD CH305, Chandler, AZ 85284
P. B. Fraundorf
Affiliation:
Department of Physics and Astronomy and Center for Molecular Electronics, University of Missouri at St. Louis, MO 53121
Get access

Abstract

Since the crystallographic phase and morphology of many materials changes with the crystal size in the one to hundred nanometer range and the potential technological applications of nanoparticles are enormous, a need arises to determine the crystallography of nanoparticles individually. Direct space high- resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution Z-contrast scanning TEM when combined with goniometry of direct and/or reciprocal lattice vectors offer the possibility of developing dedicated nanocrystallography characterization methods for such small nanoparticles. Although experimentally feasible for cubic nanocrystals with lattice constants larger than 0.4 nm in contemporary high-resolution TEMs with modest tilt range, image-based nanocrystallography by means of transmission electron goniometry has so far only been employed by a few specialists worldwide. This is likely to change in the future with the availability of aberration-corrected TEMs. The reasons why this change is likely to happen are outlined in this paper.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 818: Symposium M – Nanoparticles and Nanowire Building Blocks-Synthesis, Processing, Characterization and Theory , 2004 , M11.3.1
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Pitkethly, M.J., Nanoparticles as building blocks, nanotoday, p. 36–42 (2003), http://www.materialstoday.com/nanotoday.htm), supplement to Materials Today 6 (12) 2003.Google Scholar
2. Gogotsi, Y., Welz, S., Ersoy, D.A. and McNallan, M.J., “Conversion of Silicon Carbide to Crystalline Diamond-Structured Carbon at Ambient Pressure”, Nature 411, 283–287 (2001).Google Scholar
3. Welz, S., private conversation.Google Scholar
4. Jesser, W.A., Shiflet, G.J., Allen, G.L. and Crawford, J.L., Equilibrium phase diagrams of isolated nano-phases, Mat. Res. Innovat. 2, 211–216 (1999).Google Scholar
5. Wautelet, M., Effects on size, shape and environment on the phase diagrams of small structures, Nanotechnology 3, 42–43 (1992).Google Scholar
6. Wautelet, M., Size and segregation effects on the phase diagrams of nanoparticles of binary systems, Nanotechnology 12, 68–74 (2001).Google Scholar
7. Tolles, W.M., Self-Assembled Materials, MRS Bulletin 25 36–38 (2000).Google Scholar
8. Williams, D.B. and Carter, C.B., Transmission Electron Microscopy: a Textbook for Materials Science, (Plenum Press, New York, 1996).Google Scholar
9. for overviews see: http://ncem.lbl.gov/team/team_background.htm, 1st TEAM workshop: http://ncem.lbl.gov/team/TEAM Report 2000.pdf, 2nd TEAM workshop: http://ncem.lbl.gov/team/TEAM Report 2002.pdf, 3rd TEAM workshop: http://ncem.lbl.gov/TEAM3 wkshp rpt.pdfGoogle Scholar
10. Fraundorf, P., “Determining the 3D Lattice Parameters of Nanometer-sized Single Crystals from Images”, Ultramicroscopy 22, 225–230 (1987).Google Scholar
11. Möck, P., Durchführung, Verfahren zur und Untersuchungen, Auswertung von elektronenmikroskopischen German patents DE 4037346 A1 and DD 301839 A7, priority date: 21 November, 1989.Google Scholar
12. Fraundorf, P., Stereo Analysis of Single Crystal Electron Diffraction Data, Ultramicroscopy 6, 227–236 (1981).Google Scholar
13. Fraundorf, P., Stereo Analysis of Electron Diffraction Pattern from Known Crystals, Ultramicroscopy 7, 203–206 (1981).Google Scholar
14. Möck, P., A Direct Method for Orientation Determination Using TEM (I), Description of the Method. Cryst. Res. Technol. 26, 653–658 (1991); A Direct Method for Orientation Determination Using TEM (II), Experimental Example, Cryst. Res. Technol. 26, 797-801 (1991).Google Scholar
15. Möck, P., A Direct Method for the Determination of Orientation Relationships Using TEM, Cryst. Res. Technol. 26, 975–962 (1991).Google Scholar
16. Qin, W. and Fraundorf, P., Lattice parameters from direct-space images at two tilts, Ultramicroscopy 94, 245–262 (2003).Google Scholar
17. Fraundorf, P. and Qin, W., Fringe Visibility Maps, Micros. Microanal. 7 (Suppl. 2), 272–273 (1999).Google Scholar
18. Qin, W. and Fraundorf, P., Correlating Lattice Fringe Visibility with Nanocrystal Size and Orientation, Los Alamos Archives, http://arXic.org, document http://xxx.lanl.gov/abs/cond-mat/0212281, (2002).Google Scholar
19. CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Federal Republic of Germany, Tel.: +49 6221 89467-0, Fax: +49 6221 89467-29, http://www.ceos-gmbh.de/.Google Scholar