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Influence of an Applied Electric Field on the Conduction Characteristics of a Bithienyl-Capped Biphenylene and Biphenyl-Capped Oligothiophenes in Organic Field-Effect Transistor Structures

Published online by Cambridge University Press:  21 February 2012

Christopher Keil
Affiliation:
Justus-Liebig-University Giessen, Institute of Applied Physics (IAP) and Laboratory of Materials Science (LAMA), Heinrich-Buff-Ring 16, D-35392 Giessen, Germany
Frieder Müntze
Affiliation:
Justus-Liebig-University Giessen, Institute of Applied Physics (IAP) and Laboratory of Materials Science (LAMA), Heinrich-Buff-Ring 16, D-35392 Giessen, Germany
Manuela Schiek
Affiliation:
University of Southern Denmark, Mads Clausen Institute, NanoSYD, Alsion 2, DK-6400 Sønderburg, Denmark
Arne Lützen
Affiliation:
Rheinische Friedrich-Wilhelms-University of Bonn, Kekulé-Institute of Organic Chemistry and Biochemistry, Gerhard-Domagk-Strasse 1, D-53121 Bonn, Germany
Derck Schlettwein*
Affiliation:
Justus-Liebig-University Giessen, Institute of Applied Physics (IAP) and Laboratory of Materials Science (LAMA), Heinrich-Buff-Ring 16, D-35392 Giessen, Germany
*
*author to whom correspondence should be addressed at email: Schlettwein@uni-giessen.de
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Abstract

Thin films (50 nm) of 2,5-di-4-biphenylthiophene (PPTPP), 5,5´-di-4-biphenylyl-2,2´-bithiophene (PPTTPP) and 4,4´-di-2,2´-bithienylbiphenyl (TTPPTT) were vapor-deposited on microstructured gold (source- and drain-) electrode arrays on thermal SiO2 as gate dielectric with underlying Si serving as gate electrode. The films were studied in their field-effect characteristics during film growth and subsequent to it. A decay of specific conductivity and of charge carrier mobility was observed in subsequent measurements. During annealing without an applied field the films recovered but showed a second decay as soon as an electric field was applied again for repeated characterization. Induced dipoles and subsequent structural changes as well as chemical interactions with the SiO2 interface are discussed as possible origins of these observations.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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References

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