Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T19:24:47.907Z Has data issue: false hasContentIssue false

Influence of sheet electron beam irradiation (SEBI) on water wettability of hydroxy apatites for artificial bone

Published online by Cambridge University Press:  10 February 2011

J. Kawano
Affiliation:
Department of Materials Science, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259–12, Japan.
H. Izumi
Affiliation:
Department of Materials Science, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259–12, Japan.
K. Oguri
Affiliation:
Department of Physics.
A. Tonegawa
Affiliation:
Department of Physics.
T. Kawai
Affiliation:
Chemical Technology Research Section, Chemical Polymer Bio Technology Laboratory, Kobe Steel Limited.
M. Ochi
Affiliation:
Iwasaki Electric Group Company.
Y. Nishi
Affiliation:
Department of Materials Science, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259–12, Japan.
Get access

Abstract

An influence of sheet electron beam irradiation (SEBI) on the wettability is investigated of the hydroxy apatite (HAP) [Ca10(PO4)6(OH)2]. The wettability is one of the important factors to control bio-compatibility. The SEBI is homogeneously performed by an electrocurtain processor. The temperature of the sample is below 323 K just after the irradiation. The wettability is evaluated by measuring the wet angle θ in a drop of water. The SEBI increases the wettability. Based on rate process, the influence of SEBI on wettability is discussed. Using the SEBI, we can precisely control the surface condition of HAP.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Inoue, N., Kikuchi, M., Manabe, T., Shima, T. and Nishi, Y., Nucl. Instrum. Methods B 59/60, p. 1, 328(1991).Google Scholar
2. Inoue, N., Kikuchi, M., Shima, T., Iwase, M. and Nishi, Y., Phys. Lett. A 157, p. 299 (1991).Google Scholar
3. Nishi, Y., Takagi, S., Yasuda, K. and Itoh, K., J. Appl. Phys. 70, p. 367 (1991).Google Scholar
4. Nishi, Y., Takagi, S., Yasuda, K., Itoh, K. and Kawakami, M., Nucl. Instrum. Methods B 59/60, p. 1, 422(1991).Google Scholar
5. Johnson, W. A. and Mehl, R. F., Trans. AIME 35, p. 416 (1939).Google Scholar
6. Nishi, Y. and Harano, H., J. Appl. Phys. 63, p. 1,141 (1988).Google Scholar
7. Nishi, Y., Harano, H., Fukunaga, T. and Suzuki, K., Phys. Rev. B 37, p. 2,855 (1988).Google Scholar