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Interfacial Energy Level Alignment at Acid Oxidized Carbon Nanotube - Triphenyldiamine Contacts

Published online by Cambridge University Press:  01 February 2011

Li Wei Tan ,
Ross A. Hatton ,
Cristina E. Giusca  and
Ravi Silva
Li Wei Tan
Affiliation:
Li.Wei.Tan@merckchem.co.ukl.tan@surrey.ac.uk, Advanced Technology Institute, Faculty of Engineering and Physical Sciences, Guildford, United Kingdom
Ross A. Hatton
Affiliation:
ross.hatton@warwick.ac.uk, Department of Chemistry, University of Warwick, Conventry, United Kingdom
Cristina E. Giusca
Affiliation:
c.giusca@surrey.ac.uk, Advanced Technology Institute, University of Surrey, Guildford, United Kingdom
Ravi Silva
Affiliation:
s.silva@surrey.ac.uk, Advanced Technology Institute, University of Surrey, Guildford, United Kingdom
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Abstract

We report an ultraviolet photoelectron spectroscopy study of the energetics at the interface between acid oxidised carbon nanotubes and the archetypical molecular N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'biphenyl-4,4'diamine(TPD). Electrical equilibrium is achieved across both interfaces within the experiment time frame due to the formation of an interfacial dipole layer which abruptly shifts the vacuum level at the interface. To the authors knowledge this is the first reported measurement of the electronic structure of a carbon nanotube / organic semiconductor interface; a system in which the magnitude of the dipole layer formed at the interface upon contact formation is proportional to the difference in work function between the substrate and organic semiconductor overlayer.

Keywords

organicCnanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1258: Symposia P/Q/R – Low-Dimensional Functional Nanostructures-Fabrication, Characterization and Applications , 2010 , 1258-R07-06
Copyright
Copyright © Materials Research Society 2010

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References

(1) Hwang, J.; Wan, A.; Kahn, A. Materials Science & Engineering R-Reports 2009, 64, 1–31 Google Scholar
(2) Ishii, H.; Sugiyama, K.; Ito, E.; Seki, K. Advanced Materials 1999, 11, 605–625 Google Scholar
(3) Sugiyama, K.; Ishii H, Ouchi, Y.; Seki, K. Journal of Applied Physics 2000, 87, 295–298 Google Scholar
(4) Ishii, H.; Hayashi, N.; Ito, E.; Washizu, Y.; Sugi, K.; Kimura, Y.; Niwano, M. Physica Status Solidi A-Applied Research 2004, 201, 1075–1094 Google Scholar
(5) Hu, L. B.; Gruner, G.; Li, D.; Kaner, R. B.; Cech, J. Journal of Applied Physics 2007, 101, 016102.Google Scholar
(6) Li, F. J. F.; Hu, L. B. B.; Wang, L.; Zhou, Y. X.; Grüner, G.; Mark, T. J. Nano Letters 2006, 6, 2472–2477 Google Scholar
(7) van de Lagemaat, J.; Barnes, T. M.; Rumbles, G.; Saheen, S. E.; Coutts, T. J.; Weeks, C.; Levitsky, I.; Peltola, J.; Glatkowski, P. Applied Physics Letters 2006, 88, 233503–233505 Google Scholar
(8) Hatton, R. A.; Blanchard, N. P.; Tan, L. W.; Latini, G.; Cacialli, F.; Silva SRP. Organic Electronics 2009, 10, 388–395 Google Scholar
(9) Kim, K. S.; Zhao, Y.; Jang, H.; Lee, S. Y.; Kim, J.M.; Ahn, J. H.; Kim, P.; Choi, J. Y.; Hong, B. H. Nature 2009, 457, 706–710 Google Scholar
(10) Blanchard, N. P.; Hatton, R. A.; Silva SRP. Chemical Physics Letters 2007, 434 92–95.Google Scholar
(11) Hatton, R. A.; Blanchard, N. P.; Stolojan, V.; Miller, A. J.; Silva SRP. Langmuir 2007, 23, 6424–6430 Google Scholar
(12) Balasubramanian, K.; Burghard, M. Small 2007, 2, 280–292 Google Scholar
(13) Liu, J.; Rinzler, A. G.; Dai, H.; Hafner, J. H.; Bradley, R. K.; Boul, P. J.; Lu, A.; Iverson, T.; Shelimov, K.; Huffman, C. B.; Rodriguez-Macias, F.; Shon, Y. S.; Lee, T. R.; Colbert, D. T.; Smalley, R. E. Science 1998, 280, 1253–1256 Google Scholar
(14) Salzmann, C. G.; Llewellyn, S. A.; Tobias, G.; Ward, M. A. H.; Huh, Y.; Green, M. L. H. Advanced Materials 2007, 19, 883–887 10.1002/adma.200601310Google Scholar
(15) Ago, H.; Kugler, T.; Cacialli, F.; Salaneck, W. R.; Shaffer, M. S. P.; Windle, A. H.; Friend, R. H. The Journal of Physical Chemistry B 1999, 103, 8116–8121 Google Scholar
(16) Hayashi, N.; Ishii, H.; Ouchi, Y.; Seki, K. Journal of Applied Physics 2002, 92, 3784–3793 Google Scholar
(17) Sugiyama, K.; Yoshimura, D.; Miyamae, T.; Miyazaki, T.; Ishii, H.; Ou-Chi, Y.; Seki, K. Journal of Applied Physics 1998, 83, 4928–4938 Google Scholar