Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-17T17:22:51.406Z Has data issue: false hasContentIssue false

Laser Induced Deposition of YBa2Cu3O7−x Thin Films

Published online by Cambridge University Press:  28 February 2011

H. S. Kwok
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
P. Mattocks
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
D. T. Shaw
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
L. Shi
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
X. W. Wang
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
S. Witanachchi
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
Q. Y. Ying
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
J. P. Zheng
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
P. Bush
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Buffalo, NY 14260
Get access

Abstract

We describe here the deposition of the YBCO superconducting thin films by the laser evaporation technique. The characterization of this process, and possible optimization with regards to wavelength and pulse duration of the laser will be discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Lathrop, D.K., Russek, S.E. and Buhrman, R.A., Appl. Phys. Lett. 51, 1554 (1987).Google Scholar
2. Tsaur, B.Y., Dilorie, M.S. and Strauss, A.J., Appl. Phys. Lett. 51, 858 (1987).Google Scholar
3. Wu, X.D., Dijkkamp, D., Ogale, S.B., Inam, A., Chase, E.W., Miceli, P.F., Chang, C.C., Tarascon, J.M. and Venkatesan, T., Appl. Phys. Lett. 51, 861 (1987).Google Scholar
4. Cheung, J.T., Niizawa, G., Moyle, J., Ong, N.P., Paine, B.M. and Vreeland, T., J. Vac. Sci. Tech. A4, 2086 (1986).Google Scholar
5. Baleva, M.I., Maksimov, M.A., Metev, S.M. and Sendova, M.S., J. Mat. Sci. Lett. 5, 533 (1986).Google Scholar
6. Dubovski, J.I., Norman, P., Sewell, P.B., Williams, D.F., Krolicki, F. and Lewicki, M., Thin Solid Films, 142, L51 (1987).Google Scholar
7. Sankur, H., in Laser Controlled Chemical Processing of Surfaces, ed. by Johnson, A.W., Ehrlich, D.J. and Schlossberg, H.R., Mat. Res. Soc. Proc. vol. 29, p. 373, North Holland 1984.Google Scholar
8. Kwok, H.S., Mattocks, P., Shaw, D.T., Shi, L., Wang, X.W., Witanachchi, S., Ying, Q.Y. and Zheng, J.P., MRS Proceeding, 1987, to be published.Google Scholar
9. Ying, Q.Y. and Kwok, H.S., in Beam-Solid Interaction and Transient Processes, ed. Thompson, M.O., Picraux, S.J. and Williams, J.S., Mat. Res. Soc. Proc. vol. 74, pp. 179183, 1987 (Pittsburgh, PA).Google Scholar