Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-09T03:41:56.270Z Has data issue: false hasContentIssue false

Laser-Induced Local Decomposition of Adsorbed Tungsten Fluorine Molecules for Metal Deposition on Silicon

Published online by Cambridge University Press:  21 February 2011

Geoffroy Auvert
Affiliation:
C.N.E.T. B.P.98, 38243 Meylan, France
Yves Pauleau
Affiliation:
C.N.E.T. B.P.98, 38243 Meylan, France
Didier Tonneau
Affiliation:
C.N.E.T. B.P.98, 38243 Meylan, France
Get access

Abstract

Decomposition of tungsten hexafluoride on silicon substrates under CW argon laser irradiation in the visible domain has been extensively studied in presence of various buffer or reactive gases. The decomposition rate is found to be limited either by a mass transport phenomena or by a thermally activated process. It has been found that no photolytic decomposition can be invoked as the limiting step in the decomposition rate. Depending on the partial pressure of added hydrogen, irradiation results in a local deposition of tungsten, having good electrical properties. In the high pressure domain, deposition kinetics are consistent with mechanisms invoked in conventional chemical vapor deposition reactors. A different mechanism appearing in a lower hydrogen pressure domain will be tentatively interpreted in correlation with the laser-induced temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tonneau, D., Auvert, G., Pauleau, Y., J. Appl. Phys. 64 (1988) 5189.Google Scholar
2. Flicstein, J., Bourée, J.E., Applied Surf. Science 36 (1989) 443.Google Scholar
3. Lami, Ph., Pauleau, Y., J. Electrochem. Soc, 135–4 (1988) 980.Google Scholar
4. Gottsleben, O., Stuke, M., Appl. Phys. Lett., 52 (1988) 2230.Google Scholar
5. Tonneau, D., Auvert, G., Pauleau, Y., Europ. Mat. Res. Soc. Proc., 15 (1985) 125.Google Scholar
6. Tonneau, D., Auvert, G., Pauleau, Y., Thin Solid Films, 155 (1987) 75.Google Scholar
7. Tonneau, D., Auvert, G., Mat. Res. Soc. Symp. Proc. 101 (1987) 131.Google Scholar
8. Ferrieu, F., Auvert, G., Appl. Phys. 54 (1985) 2646.Google Scholar
9. Pauleau, Y., Lami, Ph., J. Electrochem. Soc, 132–11 (1985) 2779.Google Scholar
10. Bryant, W.A., J. Electrochem. Soc. 125–9 (1978) 1534.Google Scholar
11. Laidler, K.J., “Chemical KineticsMc Graw-Hill Book Co. (1965).Google Scholar