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Lorentz Microscopy and Electron Holography of Nanocrystalline Magnetic Materials

Published online by Cambridge University Press:  21 February 2011

Marc De Graef
Marc De Graef*
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, degraef@cmu.edu
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Abstract

This paper employs an analytical model for the phase shifts imparted on a beam electron by a spherical particle with a uniform magnetization. Model image simulations of Fresnel and Foucault type Lorentz microscopy contrast are presented. Estimates of a lower particle size limit for which no magnetic information can be extracted from the images are given and compared to similar estimates for the electron holography observation method. It is concluded that conventional Lorentz methods have a lower particle size limit of around 30 nm (for cobalt particles), while electron holography can be used to even smaller sizes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 577: Symposium H – Advanced Hard and Soft Magnetic Materials , 1999 , 519
Copyright
Copyright © Materials Research Society 1999

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References

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