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MOCVD of Yttria Stabilized Zirconia on Co-Cr

Published online by Cambridge University Press:  15 February 2011

Anton C. Greenwald ,
Peter G. Loges  and
Alain E. Kaloyeros
Anton C. Greenwald
Affiliation:
Spire Corporation, Patriots Park, Bedford MA 01730
Peter G. Loges
Affiliation:
Spire Corporation, Patriots Park, Bedford MA 01730
Alain E. Kaloyeros
Affiliation:
Dept. of Phys., SUNY Albany, 1400 Washington Ave., Albany, NY 12222
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Abstract

Thin films of yttria stabilized zirconia (YSZ) were deposited by metal organic chemical vapor deposition (MOCVD) on cobalt-chromium (Co-Cr) alloys used for orthopaedic implants. TMHD derivatives were preferred for the metalorganic sources over the less expensive fluorinated beta-diketonates as the latter left up to 1% fluorine in the film, as determined by Auger spectroscopy. Crystalline cubic structure of these YSZ films was verified by X-ray diffraction. Columnar grain growth gave a rough surface on thicker YSZ films, which increased wear of the mating polyethylene component during simulation tests. YSZ films under one micron thick were mirror smooth and reduced wear of the polymer component by 70% compared to uncoated Co-Cr. Film adhesion was excellent.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 363 , 1994 , 89
Copyright
Copyright © Materials Research Society 1995

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