Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-20T11:23:36.014Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoindentation of Lead Free Solders for Harsh Environments

Published online by Cambridge University Press:  01 February 2011

Vitor Farinha Marques ,
Patrick Grant  and
Colin Johnston
Vitor Farinha Marques
Affiliation:
vitor.marques@materials.ox.ac.uk, University of Oxford, Department of Materials, Begbroke Business and Science Park, Sandy Lane, Yarnton, OX5-1PF, Oxford, N/A, United Kingdom
Patrick Grant
Affiliation:
patrick.grant@materials.ox.ac.uk, University of Oxford, Department of Materials, Oxford, OX5 1PF, United Kingdom
Colin Johnston
Affiliation:
colin.johnston@materials.ox.ac.uk, University of Oxford, Department of Materials, Oxford, OX5 1PF, United Kingdom
Get access

Abstract

To better understand the factors governing the reliability of lead free solders during severe excursions in temperature, the hardness and elastic modulus of the micro-phases formed in a Sn-Ag-Cu/Cu solder joint were characterized using nanoindentation at temperatures from 25 to 175°C. The creep behaviour of the different micro-phases was also studied as function of temperature. The hardness and elastic modulus of Cu6Sn5, Cu3Sn had a weak dependence on temperature, while primary Sn, eutectic regions and electroplated Cu hardness and modulus were sensitive to temperature. Creep studies indicated that intermetallic were more creep resistant than softer phases that readily underwent creep, the type and rate of which was shown to be strongly temperature dependent.

Keywords

nano-indentationmicroelectronicssoldering
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1079: Symposium N – Materials and Processes for Advanced Interconnects for Microelectronics , 2008 , 1079-N05-13
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Mahmudi, R., Geranmayeh, A.R. and Rezaee-Bazzaz, A., Mater. Sci. Eng. A 448, (2007) 287–293 Google Scholar
[2] Shapiro, Andrew A., Bonner, J. Kirk, Ogunseitan, Oladele A., Saphores, Jean-Daniel M., and Schoenung, Julie M., IEEE Transactions 29, (2006) 60–70 Google Scholar
[3] Park, Tae-Sang, Lee, Soon-Bok, J. Electron. Packag. 127, (2005) 237–244 Google Scholar
[4] Chromik, R.R., Vinci, R.P., Allen, S.L., Not, M.R., J. Mater. Res. 18, (2003), 2551–2661 Google Scholar
[5] Deng, X., Chawla, N., Chawla, K.K., Koopman, M., Acta Mater 52, (2004) 4291–4303 Google Scholar
[6] Goodall, R., Clyne, T.W., Acta Mater. 54, (2006), 5489–5499 Google Scholar
[7] Beake, B.D., Smith, J.F., Philos. Mag. A 82, (2003) 2179–2186 Google Scholar
[8] Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7 (1992). 1564–1580 Google Scholar
[9] Neville, Alex A. Moody, R., , William and Gerberich, W., J. Mater. Res. 19, (2004) 2650–2657 Google Scholar
[10] Laurila, T., Vuorinen, V., Kivilahti, J.K., Mater. Sci. Eng R 49, (2005) 1–60 Google Scholar
[11] Sherby, O.D.: In Nature and Properties of Materials: An Atomistic Interpretation, edited by Pask, J. (Wiley, New York, 1967) 376 Google Scholar
[12] Chang, Shou-Yi, Lee, Yu-Shuien, Chang, Ting-Kui, Mater Sci. Eng A 423 (2006) 52–56 Google Scholar
[13] Rhee, H., Lucas, J.P., Subramanian, K.N., J. Mater. Sci. 13, (2002) 477–484 Google Scholar
[14] Huang, M.L., Wang, L., Wu, C.M.L., J. Mater. Res. 17, (2002) 2897–2903 Google Scholar
[15] Dutta, I., Park, C., Choi, S., Mater Sci. Eng A 379, (2004) 401–410 Google Scholar
[16] Chromik, R.R., Wang, D-N., Shugar, A., Limata, L., Notis, M.R., Vinci, R.P., J. Mater. Res. 20, 8, (2005)2161–2172 Google Scholar
[17] Kerr, M., Chawla, N., Acta Mater. 52, (2004) 4527–4535 Google Scholar