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A Novel Technique for Determining Local Dielectric Function During Ferroelectric to Paraelectric Phase Transformation in Barium Titanate with a Transmission Eels

Published online by Cambridge University Press:  15 February 2011

Kalpana S Katti ,
Maoxu Qian  and
Mehmet Sarikaya
Kalpana S Katti
Affiliation:
Department of Materials Science and Engineering, Box 352120, University of Washington, Seattle WA 98195, USA
Maoxu Qian
Affiliation:
Department of Materials Science and Engineering, Box 352120, University of Washington, Seattle WA 98195, USA
Mehmet Sarikaya
Affiliation:
Department of Materials Science and Engineering, Box 352120, University of Washington, Seattle WA 98195, USA
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Abstract

In this work a transmission electron microscopy (TEM) technique was used in obtaining local dielectric properties calculated from optical parameters for dynamic investigation of the effect of cubic to tetragonal phase transformation in barium titanate. In order to obtain in situ local dielectric during phase transformation, Kramers-Kronig relations were applied using the transmission electron energy loss (EELS) measurements. The optical excitations in the EELS spectra were consistent with the band structure results. The Re (1/ε) (real part of the dielectric function) obtained from the energy loss data indicated a change at the phase transformation. A broadening of the valence plasmon excitation suggested an order-disorder nature to the cubic to tetragonal transformation. In situ electron energy loss near edge structure (ELNES) studies from 500–700 eV energy range near the O-K edge exhibited a pre-edge feature that is associated with the Ti-L1, edge which further indicates an order-disorder nature to the phase transformation. The significance of the results is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 404: Symposium J – In Situ Electron and Tunneling Microscopy of Dynamic Processes , 1995 , 101
Copyright
Copyright © Materials Research Society 1996

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References

1. Lines, M. E. and Glass, A. H., Principles and Applications of Ferroelectrics and Related Materials (Clarenden Press, Oxford, UK, 1977).Google Scholar
2. Jona, F. and Shirane, G., Ferroelectric Crystals (Dover Publications, New York 1993).Google Scholar
3. Ravel, B. and Stem, E. A., Physica B, 208&209, 316–318 (1995).Google Scholar
4. Ravel, B., Sicron, N., Yacoby, Y., Stem, E. A., Dogan, F. and Rehr, J. J., Ferroelectrics, 164, 265–277 (1995).Google Scholar
5. Daniels, J., Festenberg, C. v., Raether, H., and Zeppenfeld, K., in Springer Tracts in Modern Physics, 54 (Springer-Verlag, Berlin, 1970) pp. 77–135.Google Scholar
6. Turowski, M. A. and Kelly, T. F., Ultramicroscopy, 41, 41–54 (1992).Google Scholar
7. Wang, Y. Y., Feng, G. E., Sutto, T. E. and Shao, Z., Phys. Rev. B., 44 [13] pages?? (1991).Google Scholar
8. Uspenskii, Y. A. and Rashkeev, S. N., Phys. Letts. A, 153, [6–7] 373–6 (1991).Google Scholar
9. Wang, Y. Y., Zhang, H., Dravid, V. P., Han, P. D., and Payne, D. A., Phys Rev B, 48 [13] 9810–14 (1993).Google Scholar
10. Browning, N. D., Yuan, J., and Brown, L. M., Ultramicroscopy, 38, 291–298 (1991).Google Scholar
11. Schwartz, R. N. and Wechsler, B. A., J. Am. Ceram. Soc., 73, [11] 3200–5 (1990).Google Scholar
12. Schwartz, R. N., Wechsler, B. A. and West, L., Appl. Phys. Lett., 67, 1352–4 (1995).Google Scholar
13. Hudson, L. T., Kurtz, R. L., Robey, S. W., Temple, D., and Stockbauer, R. L., Phys. Rev. B., 47 [3] 1174–1180 (1993).Google Scholar
14. Holma, M., Kitamura, M., and Chen, H., J. Appl. Phys., 76 [1] 451–454 (1994).Google Scholar
15. Grunes, L. A., Leapman, R. D., Wilker, C. N., Huffmann, R. and Kunz, A. B., Phys. Rev B., 25, 7157 (1982)Google Scholar
16. Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1986).Google Scholar
17. CRC Handbook of Chemistry and Physics, (1994).Google Scholar
18. Qian, M. and Sarikaya, M., Ultramicroscopy, 59, 137 (1995)Google Scholar
19. Pertosa, P. and Michel-Calendini, F. M., Phys. Rev. B, 17, 2011 (1978)Google Scholar