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On-Line Transverse Control of Materials by Means of Microwave Imaging Techniques

Published online by Cambridge University Press:  28 February 2011

J.Ch. Bolomey ,
G. Cottard  and
B.J. Cown
J.Ch. Bolomey
Affiliation:
Groupe d'Electromagnétisme, Ecole Supérieure d'electricité, Plateau du Moulon, 91192 Gif-sur-Yvette Cedex, France
G. Cottard
Affiliation:
SATIMO, Ferme du Moulon, 91190 Gif-sur-Yvette, France
B.J. Cown
Affiliation:
Georgia Tech Research Institute, EMED Division, Atlanta, GA 30332, USA
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Abstract

This paper analyzes of the impact of a new generation of microwave sensors on the transverse control of conveyed products and materials. Such sensors, resulting from recent developments in microwave imaging technology, offer significant improvements in comparison to other more classical microwave sensors. The main features of the new sensors are presented and discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 189: Symposium L – Microwave Processing of Materials II , 1990 , 49
Copyright
Copyright © Materials Research Society 1991

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References

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