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Overview of Comnonent and Device Characterization

Published online by Cambridge University Press:  10 February 2011

Doug Rytting
Doug Rytting*
Affiliation:
Research and Technology Manager Santa Rosa Systems Division, Hewlett Packard 1400 Fountain Grove Parkway, Santa Rosa, CA 95403
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Abstract

The electronics market is constantly pushing the state of the art in design to reduce cost, size, weight, and power consumption. New designs are emerging causing rapid changes in technology driving high design turnover. This drives the need for component and material measurements that will reduced design cycles and time to market. In the design and measurement of linear devices, error corrected S-parameters are traditionally measured with a network analyzer. the network analyzer combines magnitude with phase measurements for improved accuracy. Time domain techniques are used to get a better physical understanding of the device characteristics. Error correction procedures have been improved to provide high accuracy and ease of use. New methods to measure impedance results in high precision capacitor and inductor models necessary for both surface mount and integrated circuit applications. Note: In the following paper the relevant text follows each slide.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 219
Copyright
Copyright © Materials Research Society 1996

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