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Oxygen Segregation to Nanopipes in Gallium Nitride

Published online by Cambridge University Press:  01 February 2011

Michael E Hawkridge  and
David Cherns
Michael E Hawkridge
Affiliation:
m.hawkridge@bristol.ac.uk, University Of Bristol, Physics, H H Wills Physics Laboratory, Tyndalls Ave., Bristol, N/A, BS8 1TL, United Kingdom, 01179288750
David Cherns
Affiliation:
d.cherns@bristol.ac.uk, University Of Bristol, Physics, United Kingdom
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Abstract

This paper examines the core structure and composition of threading dislocations in GaN grown by hydride vapour phase epitaxy. Transmission electron microscopy showed that screw dislocations have widely varying core structures from open cores (“nanopipes”) to closed cores, with irregular variations between the two observed along the length of many dislocations. New evidence was found demonstrating that the equilibrium structure of screw dislocations is a closed core configuration. Electron energy loss spectroscopy combined with high resolution imaging showed that 1.7±0.3 monolayers of nitrogen were substituted by oxygen at the surfaces of nanopipes. In contrast, closed core dislocations showed little evidence of oxygen segregation. It is argued that these results support a model where nanopipe formation is controlled by the segregation of oxygen to pits predominately associated with, albeit not exclusively, dislocations. The implication of the results in understanding the electronic behavior of dislocations in GaN is also discussed.

Keywords

transmission electron microscopy (TEM)vapor phase epitaxy (VPE)electron energy loss spectroscopy (EELS)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 892 , 2005 , 0892-FF22-05
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

1. Cherns, D., Young, W. T., Steeds, J. W., Ponce, F. A. and Nakamura, S., J. Cryst. Growth 178, 201–206 (1997)CrossRefGoogle Scholar
2. Cherns, D., J. Phys. Condens. Matter 12, 10205–10212 (2000)CrossRefGoogle Scholar
3. Liliental-Weber, Z., Chen, Y., Ruvimov, S., and Washburn, J., Phys. Rev. Lett. 79, 2835 (1997)CrossRefGoogle Scholar
4. Arslan, I. and Browning, N.D., Phys. Rev. Lett. 91, 165501 (2003)CrossRefGoogle Scholar
5. Cherns, D., Wang, Y.Q., Liu, R. and Ponce, F.A., Appl. Phys. Lett 81, 4541–4543 (2002)CrossRefGoogle Scholar
6. Simpkins, BS, Yu, ET, Chowdhury, U, Wong, MM, Zhu, TG, Yoo, DW, Dupuis, RD, J. Appl. Phys. 95, 6225–6231 (2004)CrossRefGoogle Scholar
7. Baines, M.Q., Cherns, D., Hsu, J.W.P. and Manfra, M.J., MRS Proc. Vol. 743 Paper L2.5;Google Scholar
Baines, M.Q., Cherns, D., Foxon, C.T. and Manfra, M.J., MRS Proc. Vol 798, paper Y9.3Google Scholar
8. Ponce, F. A., Cherns, D., Young, W. T. and Steeds, J. W., Appl. Phys. Lett. 69 (1996) 770–772 CrossRefGoogle Scholar
9. Northrup, J E 2001, Applied Physics Letters 78 (16), 2288 CrossRefGoogle Scholar
10. Watkins, N.J., Wicks, G.M. and Gao, Y., Appl. Phys. Lett. 75, 2602–2604 (1999)CrossRefGoogle Scholar
11. Sun, X.L., Goss, S.H., Brillson, L.J., Look, D.C. and Molnar, R.J., J. Appl. Phys. 91, 6729–6738 (2002)CrossRefGoogle Scholar
12. Elsner, J, Jones, R, Haugk, M, Gutierrez, R, Frauenheim, T, Heggie, MI, Oberg, S, Briddon, PR Appl. Phys. Lett. 73, 3530–3532 (1998)CrossRefGoogle Scholar
13. Hansen, P. J., Strausser, Y. E., Erickson, A. N., Tarsa, E. J., Kozodoy, P., Brazel, E. G., Ibbetson, J. P., Mishra, U., Narayanamurti, V., DenBaars, S. P., and Speck, J. S., Appl. Phys. Lett. 72, 2247 (1999)CrossRefGoogle Scholar
14. Mattila, T. and Nieminen, R. M., Phys. Rev. B 54, 16676–16682 (1996)CrossRefGoogle Scholar
15. Butcher, K. S. A., Thimmers, H., Chen, A. P.-T., Chen, P. P-T., Weijers, T. D. M., Goldys, E.M., Tansley, T. L., Elliman, R. G. and Freitas, J. A. Jr., J. Appl. Phys. 92, 3397–3403 (2002)CrossRefGoogle Scholar
16. Pailloux, F., Colin, J., Barbot, J.F. and Grihle, J., Appl. Phys. Lett. 86, 131908 (2005)CrossRefGoogle Scholar
17. Oila, J, Kivioja, J, Ranki, V, Saarinen, K, Look, DC, Molnar, RJ, Park, SS, Lee, SK, Han, JY, Appl. Phys. Lett. 82, 3433–3435 (2003)CrossRefGoogle Scholar
18. Cherns, D. and Jiao, C.G., Phys. Rev. Lett. 87 (20), 5504–5507 (2001);CrossRefGoogle Scholar
Cherns, D., Jiao, C.G., Mokhtari, H., Cai, J. and Ponce, F.A., Phys. Stat. Sol. B 234, 924–930 (2002)3.0.CO;2-8>CrossRef3.0.CO;2-8>Google Scholar