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Probing Silicate/Sapphire Interfaces with AFM and Nanoindentation

Published online by Cambridge University Press:  15 February 2011

E. T. Lilleodden ,
A. V. Zagrebelny ,
S. Ramamurthy  and
C. B. Carter
E. T. Lilleodden
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, carter@cems.umn.edu
A. V. Zagrebelny
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, carter@cems.umn.edu
S. Ramamurthy
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, carter@cems.umn.edu
C. B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, carter@cems.umn.edu
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Abstract

A nanoindentation study of a calcium-aluminosilicate/α-alumina system is described. Thinfilms of CaAl2Si2O8 glass were deposited on α-alumina single crystals of {1120} and {1102} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 436: Symposium CC – Thin Films Stresses and Mechanical Properties VI , 1996 , 177
Copyright
Copyright © Materials Research Society 1997

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