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Real-Space Imaging of Nanoscale Electrodeposited Ceramic Superlattices in the Scanning Tunneling Microscope

Published online by Cambridge University Press:  25 February 2011

Teresa D. Golden ,
Ryne P. Raffaelle ,
Richard J. Phillips  and
Jay A. Switzer
Teresa D. Golden
Affiliation:
University of Missouri-Rolla, Graduate Center for Materials Research, Rolla, Missouri 65401
Ryne P. Raffaelle
Affiliation:
Florida Institute of Technology, Department of Physics and Space Sciences, Melbourne, Florida 32901
Richard J. Phillips
Affiliation:
University of Missouri-Rolla, Graduate Center for Materials Research, Rolla, Missouri 65401
Jay A. Switzer
Affiliation:
University of Missouri-Rolla, Graduate Center for Materials Research, Rolla, Missouri 65401
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Abstract

We have imaged fractured cross-sections of electrodeposited ceramic oxides based on the TI-Pb-O system using a scanning tunneling microscope. The goal of this work is to measure both the modulation wavelength and compositional profile of the superlattices by mapping out the electronic properties in real space on a nanometer scale. Fourier analysis was done on STM images of all superlattices to yield the modulation wavelength. The modulation wavelength from STM was then compared with those obtained, by Faraday calculation and x-ray diffraction. The STM can be used to design “better” superlattices. We have found that the composition profile in superlattices deposited by modulating the potential was more square than in superlattices deposited by modulating the current.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 286: Symposium J – Nanophase and Nanocomposite Materials , 1992 , 361
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

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