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Silicon-based Integrated Optics: Waveguide Technology to Microphotonics

Published online by Cambridge University Press:  01 February 2011

Siegfried Janz ,
Alexei Bogdanov ,
Pavel Cheben ,
André Delâge ,
Boris Lamontagne ,
Marie-Joseé Picard ,
Dan-Xia Xu ,
Kuan Pei Yap  and
Winnie N. Ye
Siegfried Janz
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Alexei Bogdanov
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Pavel Cheben
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
André Delâge
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Boris Lamontagne
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Marie-Joseé Picard
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Dan-Xia Xu
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Kuan Pei Yap
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
Winnie N. Ye
Affiliation:
Institute for Microstructural Sciences, National Research Council Canada, 1200 Montreal Rd. Ottawa, Ontario, Canada, K1A 0R6; e-mail: siegfried.janz@nrc-cnrc.gc.ca
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Abstract

Using a waveguide spectrometer chip as an example, we describe how high index contrast waveguides systems such as silicon-on-insulator can be combined with microphotonic design rules to extend the performance of waveguide devices. The challenges arising in the implementation of silicon microphotonic technology are discussed, and recent work addressing the issues of waveguide coupling, polarization sensitivity, waveguide loss and massively parallel data acquisition is reviewed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 832: Symposium F – Group IV Semiconductor Nanostructures , 2004 , F1.1
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Ahmad, R.U., Pizzuto, F., Camarda, G.S., Espinola, R.L., Rao, H., and Osgood, R.M. Jr, IEEE Phot. Technol. Lett. 14, 65 (2002).Google Scholar
2. Janz, S., Balakrishnan, A., Charbonneau, S., Cheben, P., Cloutier, M., Delâge, A., Dossou, K., Erickson, L., Gao, M., Krug, P.A., Lamontagne, B., Packirisamy, M., Pearson, M., and Xu, D.-X., IEEE Phot. Technol. Lett. 16, 503 (2004).Google Scholar
3. Hibino, Y., IEEE J. Sel. Top. Quantum Electron. 8, 1090 (2002).Google Scholar
4. Cheben, P., Bogdanov, A., Delâge, A., Janz, S., Lamontagne, B., Picard, M.-J., Post, E., Xu, D.-X., SPIE Proc. Vol. 5644–17, Photonics Asia 2004 (in press, 2004).Google Scholar
5. Sure, , Dillon, T., Murakowski, J., Lin, C., Pustai, D., and Prather, D.W., Opt. Express 11, 3555 (2003).Google Scholar
6. Almeida, V.R., Panepucci, R.R., and Lipson, M., Opt. Lett. 28, 1302 (2003).Google Scholar
7. Masanovic, G., Passaro, V.M.N., and Reed, G.T., IEEE Phot. Technol. Lett. 15, 1395 (2003).Google Scholar
8. Delâge, A., Janz, S., Xu, D.-X., Dalacu, D., Lamontagne, B., and Bogdanov, A., SPIE Proc. Vol. 5577, Photonics North 2004 (in press, 2004).Google Scholar
9. Shiraishi, K., Tsai, C.S., Yoda, H., and Minagawa, K., Proc. of CLEO/Pacific RIM 2003, CD-ROM (IEEE, Piscataway, NJ, 2003).Google Scholar
10. Payne, F.P. and Lacey, J.P.R., Opt. and Quant. Electron. 26, 977 (1994).Google Scholar
11. Lee, K.K., Lim, D.R., Luan, H.-C., Agarawal, A., Foresi, J., and Kimmerling, L.C., Appl. Phys. Lett. 77, 1617 (2000).Google Scholar
12. Lee, K.K., Lim, D.E., Kimmerling, L.C., Shin, J., and Cerrina, F., Opt. Lett. 26, 1888 (2001).Google Scholar
13. Janz, S., Baribeau, J.-M., Delâge, A., Lafonaine, H., Mailhot, S., Williams, R.L., Xu, D.-X., Bruce, D.M., Jessop, P.E., and Robillard, M., IEEE J. Sel. Top. Quantum Electron. 4, 990 (1998).Google Scholar
14. Vivien, L., Laval, S., Dumont, B., Lardenois, S., Koster, A., and Kassan, E., Opt. Comm. 210, 43 (2002).Google Scholar
15. Xu, D.-X., Cheben, P., Delâge, A., Janz, S., Lamontagne, B., Picard, M.-J., and Ye, W.N., Opt. Lett. 29, 2384 (2004).Google Scholar
16. Xu, D.-X., Cheben, P., Dalacu, D., Janz, S., Picard, M.-J., Tarr, N.G., and Ye, W.N., Proc. of 16th LEOS Annual Meeting, 590 (IEEE, Piscataway, NJ, 2003).Google Scholar