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Size Effect in the Plasticity of Multiscale Nanofilamentary Cu/Nb Composite Wires During in-situ Tensile Tests Under Neutron Beam

Published online by Cambridge University Press:  26 February 2011

Vanessa Vidal ,
Ludovic Thilly ,
Steven Van Petegem ,
Uwe Stuhr ,
Florence Lecouturier ,
Pierre-Olivier Renault  and
Helena Van Swygenhoven
Vanessa Vidal
Affiliation:
vvidal@lncmp.org, CNRS, LNCMP, 143 avenue de Rangueil, TOULOUSE, 31400, France
Ludovic Thilly
Affiliation:
ludovic.thilly@univ-poitiers.fr, CNRS-University of Poitiers, Laboratoire de Métallurgie Physique, SP2MI, Boulevard M. et P. Curie, Teleport 2, BP 30179, Futuroscope Chasseneuil, 86962, France
Steven Van Petegem
Affiliation:
steven.vanpetegem@psi.ch, Paul Scherrer Institut, Villigen-PSI, CH-5232, Switzerland
Uwe Stuhr
Affiliation:
uwe.stuhr@psi.ch, Paul Scherrer Institut, Villigen-PSI, CH-5232, Switzerland
Florence Lecouturier
Affiliation:
lecouturier@lncmp.org, CNRS-UPS-INSA, Laboratoire National des Champs Magnétiques Pulsés, 143 avenue de Rangueil, Toulouse, 31400, France
Pierre-Olivier Renault
Affiliation:
pierre.olivier.renault@univ-poitiers.fr, CNRS-University of Poitiers, Laboratoire de Métallurgie Physique, SP2MI, Boulevard M. et P. Curie, Teleport 2, BP 30179, Futuroscope Chasseneuil, 86962, France
Helena Van Swygenhoven
Affiliation:
helena.vanswygenhoven@psi.ch, Paul Scherrer Institut, Villigen-PSI, CH-5232, Switzerland
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Abstract

Copper-based high strength nanofilamentary wires reinforced by bcc nanofilaments (Nb or Ta) are prepared by severe plastic deformation for the winding of high pulsed magnets. In-situ tensile tests under neutron beam were performed on a Cu/Nb nanocomposite composed of a multiscale Cu matrix embedding 554 Nb filaments with a diameter of 267 nm and spacing of 45 nm. The evolution of elastic strains for individual lattice plane in each phase and peak profiles in the copper matrix versus applied stress evidenced the co-deformation behavior with different elastic-plastic regimes and load sharing: the Cu matrix exhibits size effect in the finest channels while the Nb nanowhiskers remain elastic up to the macroscopic failure, with a strong load transfer from the copper matrix onto zones that are still in the elastic regime. Taking into account results from residual lattice strains also determined by neutron diffraction, the yield stress in the finest Cu channels is in agreement with calculations based on a single dislocation regime.

Keywords

nanostructureneutron scatteringstress/strain relationship
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 977: Symposium FF – Processing-Structure-Mechanical Property Relations in Composite Materials , 2006 , 977-FF07-07-EE07-07
Copyright
Copyright © Materials Research Society 2007

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References

1. Han, K., Embury, J. D., Sims, J. R., Campbell, L. J., Schneider-Muntau, H. -J., Pantsyrnyi, V. I., Shikov, A., Nikulin, A. and Vorobieva, A., Mater. Sc. and Eng. A267, 99 (1999).Google Scholar
2. Spencer, K., Lecouturier, F., Thilly, L., and Embury, J. D., Adv. Eng. Mater. 6, 290 (2004).Google Scholar
3. Dupouy, F., Peyrade, J. P., Askénazy, S., and Legat, D., Physica B 211, 43 (1995).Google Scholar
4. Thilly, L., Véron, M., Ludwig, O., Lecouturier, F., Peyrade, J.P. and Askénazy, S., Philosophical Magazine A, 82(5), 925 (2002)Google Scholar
5. Misra, A., Verdier, M., Lu, Y. C., Kung, H., Mitchell, T. E., Nastasi, M., and Embury, J. D., Scr. Mater. 39, 555 (1998).Google Scholar
6. Stuhr, U., Spitzer, H., Egger, J., Hofer, A., Rasmussen, P., Graf, D., Bollhalder, A., Schild, M., Bauer, G., and Wagner, W., Nucl. Instrum. Methods Phys. Res. A 545, 330 (2005).Google Scholar
7. Thilly, L., Vidal, V., Van Petegem, S., Stuhr, U., Lecouturier, F., Renault, P. O., and Van Swygenhoven, H., Appl. Phys. Lett. 88, 191906 (2006)Google Scholar
8. Han, K., Lawson, A. C., Wood, J. T., Embury, J. D., Von Dreele, R. B., et Richardson, J. W.. Philosophical Magazine, 84(24), 2579 (2004).Google Scholar