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TEM and STEM study of the Au nano-particles supported on metal oxides

Published online by Cambridge University Press:  01 February 2011

Tomoki Akita ,
Koji Tanaka ,
Masanori Kohyama  and
Masatake Haruta
Tomoki Akita
Affiliation:
t-akita@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Ubiquitous Energy Devices, Midorigaoka 1-8-31, Ikeda, N/A, Japan, +81-72-751-9732, +81-72-751-9714
Koji Tanaka
Affiliation:
t-akita@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Ubiquitous Energy Devices, Midorigaoka 1-8-31, Ikeda, N/A, Japan, +81-72-751-9732, +81-72-751-9714
Masanori Kohyama
Affiliation:
t-akita@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Ubiquitous Energy Devices, Midorigaoka 1-8-31, Ikeda, N/A, Japan, +81-72-751-9732, +81-72-751-9714
Masatake Haruta
Affiliation:
t-akita@aist.go.jp, National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Ubiquitous Energy Devices, Midorigaoka 1-8-31, Ikeda, N/A, Japan, +81-72-751-9732, +81-72-751-9714
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Abstract

The Au nano-particles are deposited on the metal oxide substrate, TiO2 and CeO2, and the structure of the Au particles and Au-metal oxide interface was observed by TEM and HAADF-STEM. It was found that the growth of Au particles on TiO2 and CeO2 by heating treatment is suppressed in the reductive atmosphere. The HAADF-STEM observation was carried out and the atomically resolved HAADF-STEM images in profile-view are successfully obtained for Au/TiO2 and Au/CeO2 samples. The Au particles tend to supported on CeO2 surface with the flat interface compared to the TiO2 substrate. The incoherent interface is observed for the Au particles-CeO2 interface.

Keywords

Autransmission electron microscopy (TEM)scanning transmission electron microscopy (STEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C17-14
Copyright
Copyright © Materials Research Society 2008

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