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TEM Studies of Precipitate Growth at the Atomic Level

Published online by Cambridge University Press:  25 February 2011

J. M. Howe  and
R. Gronsky
J. M. Howe
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie-Mellon University, Pittsburgh, PA 15213
R. Gronsky
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, CA 94720
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Abstract

Recent advances in transmission electron microscopy instrumentation and technique now make it possible to study the shape-evolution of precipitates in metallic alloys at the atomic level. This investigation demostrates how a combination of transmission electron microscopy techniques; namely, high-resolution electron microscopy, image simulation, energy-dispersive x-ray spectroscopy and convergent-beam electron diffraction are used to characterize the atomic structures, chemistry and growth mechanisms of γ' precipitate plates in an Al-4.2 a/o Ag alloy aged for 30 min. at 350°C. The complimentary information obtained from each of these techniques allows modelling of the growth process at the atomic level, thus providing insight into the basic precipitation behavior of alloys.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 62: Symposium Q – Materials Problem Solving with the Transmission Electron Microscope , 1985 , 241
Copyright
Copyright © Materials Research Society 1986

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