Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-29T09:27:39.725Z Has data issue: false hasContentIssue false
  • English
  • Français

Thermal and X-Ray Diffraction Studies of Doped and Undoped Single Crystal and Polycrystalline BaTiO3

Published online by Cambridge University Press:  16 February 2011

L.G. Carreiro ,
J.V. Marzik  and
K.K Deb
L.G. Carreiro
Affiliation:
US Army Research Laboratory, Materials Directorate, Watertown, MA 02172
J.V. Marzik
Affiliation:
US Army Research Laboratory, Materials Directorate, Watertown, MA 02172
K.K Deb
Affiliation:
US Army Research Laboratory, Infrared/Optics Technology Office, Fort Belvoir, VA 22060
Get access

Abstract

Calorimetric changes in a series of pure and doped single crystal and polycrystalline BaTiO3 were studied using differential scanning calorimetry over the temperature range of-110°C to 200°BC. The dopants, oxides of niobium and iron were varied from 0.5 to 8 mole percent, and strontium was varied from 5 to 35 mole percent. Endotherms were observed corresponding to three crystallographic transitions. The highest observed thermal transition corresponds to a tetragonal to cubic crystallographic transition and is also associated with the Curie temperature in these materals. Two additional endothermic transitions were also observed, an intermediatetemperature orthorhombic to tetragonal transition, and a low-temperature rhombohedral to orthorhombic transition. The three dopants decreased the crystallographic transition temperatures and Curie temperature as the dopant concentration was increased. X-ray diffraction was used to identify phases present and to determine the extent of solid solution. It is expected that these materials will display improved infrared detection as well as opto-electronic properties.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 360 , 1994 , 543
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Lines, M.E. and Glass, A.M., Principals and Applications of Ferroelectics (Clarendon Press, Oxford, 1977), p. 244.Google Scholar
2.Burfoot, J.C. and Taylor, G.W., Polar Dielectrics and their Applications (University of California Press, Berkeley and Los Angeles, 1979), p. 312.Google Scholar
3.Aldrich, R.E., Kroland, F.J. and Simmons, N.A, IEEE Trans. Electron Devices, ED-20, 1015 (1973).Google Scholar
4.Monteme, G., Ingold, M., Looser, H. and Gunter, P., Ferroelectrics, 92, 281 (1984).Google Scholar
5.Witter, D.E., Beratan, H.R., Kulwicki, B.M. and Amin, Ahmed, Texas Instrument Technical Journal, 11, 19 (1994).Google Scholar
6.Patel, A., Tossell, D.A., Shorrocks, N.M., Whatmore, R.W. and Watton, R., Mater. Res. Soc. Proc., 310, 53 (1993).Google Scholar
7.Herbert, J.M., Ceramic Dielectrics and Capacitors, (Gordon and Breach Scvience Publishers, New York, 1985), p. 151.Google Scholar
8.Rushman, D.F. and Strivens, M.A., Trans. Faraday Soc. 42A, 231 (1946).Google Scholar
9.Deb, K.K., Hill, M.D. and Kelly, J.F., J. Mater. Res. 7, 3296 (1992).Google Scholar