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Thickness Dependence of Vortex Pinning in Epitaxial Tl-Ca-Ba-Cu-O Thin Films

Published online by Cambridge University Press:  26 February 2011

E. L. Venturing ,
W. Y. Lee ,
B. Morosin  and
D. S. Ginley
E. L. Venturing
Affiliation:
Sandia National Laboratories, Dept. 1154, Albuquerque, NM 87185–5800
W. Y. Lee
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, CA 95120
B. Morosin
Affiliation:
Sandia National Laboratories, Dept. 1154, Albuquerque, NM 87185–5800
D. S. Ginley
Affiliation:
Sandia National Laboratories, Dept. 1154, Albuquerque, NM 87185–5800
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Abstract

The critical current density inferred from magnetization hysteresis for epitaxial Tl2Ca2Ba2Cu3O10 films on LaAlO3 exhibits a pronounced increase with film thickness in the high-field, high-current regime. This thickness dependence does not extend to comparatively “thick” single crystals, however, suggesting that the grain boundaries play a major role in collective vortex pinning for Tl-based superconducting thin films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 401
Copyright
Copyright © Materials Research Society 1992

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References

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