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To Bias or Not to Bias? An “How-To” Guide for Spectral Response Measurements of Thin Film Multi-Junction Photovoltaic Modules

Published online by Cambridge University Press:  10 May 2012

Mauro Pravettoni
Mauro Pravettoni*
Affiliation:
University of Applied Sciences and Arts of Southern Switzerland, Institute of Applied Sustainability to the Built Environment, 6952 Canobbio, Switzerland
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Abstract

Current-matching between junctions in a multi-junction photovoltaic device is fundamental for its performance prediction: the measurement of the spectral response of each junction provides a valuable information to optimize the device performance. Various aspects make spectral response measurements of such devices particularly challenging. In this work these aspects are analysed theoretically and guidelines to avoid their impact in the experimental practice are given.

Keywords

photovoltaicradiation effectsamorphous
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1426: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology–2012 , 2012 , pp. 81 - 86
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

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Pravettoni, M., and Virtuani, A., in Amorphous and Polycrystalline Thin-Film Silicon Science and Technology, edited by Yan, B., Higashi, S., Tsai, C.C., Wang, Q., and Gleskova, H. (Mater. Res. Soc. Symp. Proc. 1321, Pittsburgh, PA, 2011) pp. 51–56.Google Scholar
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Li, J.-J., Lim, S. H., Allen, C. R., Ding, D., and Zhang, Y.-H., IEEE J. Photovolt. 1(2), 225–230 (2011).CrossRefGoogle Scholar
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