Hostname: page-component-77c89778f8-m8s7h Total loading time: 0 Render date: 2024-07-16T11:38:54.515Z Has data issue: false hasContentIssue false

Transmission Electron Microscopy Study of Thick Copper-304 Stainless Steel Multilayers

Published online by Cambridge University Press:  21 February 2011

M. A. Wall
Affiliation:
Lawrence Livermore National Laboratory Chemistry and Materials Science Department Livermore, CAU.S.A.94550
T. W. Barbee Jr.
Affiliation:
Lawrence Livermore National Laboratory Chemistry and Materials Science Department Livermore, CAU.S.A.94550
T. Weihs
Affiliation:
Lawrence Livermore National Laboratory Chemistry and Materials Science Department Livermore, CAU.S.A.94550
Get access

Abstract

Thick (10 to 25 μm), free-standing, equal layer thickness, Copper(Cu)-304 Stainless Steel(SS) multilayer foils, having periods of lnm to 100 nm, synthesized by magnetron sputter deposition, have been examined by plan view and cross-sectional transmission electron microscopy. Multilayer growth morphology, individual layer structure and crystallographic phase orientation relationships were characterized in this study. Electron Energy Loss filtered imaging of a 20 nm period multilayer cross-section was also performed and showed that nickel had diffused into the Cu layers from the SS during synthesis. X-ray powder diffraction scans were performed and analyzed. A pure deposit of 304SS was synthesized and had a metastable BCC structure. Multilayer samples having periods of 20 nm were found to have a coherent layered Cu(FCC)- SS(FCC) structure. At larger periods (50 & 100 nm) a bimodal Cu(FCC)-SS(FCC & BCC) structure was formed. These observations show that the 304SS will grow with a metastable BCC structure when sputter deposited. When layered with Cu(FCC) the 304SS has its equilibrium FCC structure at layer thicknesses up to 10nm as a result of epitaxy with the copper. At larger SS layer thicknesses the SS appears to locally transform to the metastable BCC structure during synthesis, refining the grain structure of the depositing SS layer and the subsequent Cu layer. This transformation significantly increases the strength of the larger period multilayer.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Baxter, C.S. and Stobbs, W.M., Ultramicroscopy 16, 213226 (1985).Google Scholar
[2] Matthews, J.W. and Blakeslee, A.E., J. Crystal Growth 27, 188195 (1974).Google Scholar
[3] Barbee, T.W. Jr., in Synthetic Modulated structures, (Academic press, 1985), pp.313.Google Scholar
[4] Wall, M.A., in Microbeam Analysis, edited by Howitt, D.G. (San Francisco Press Inc., 1991), pp.317.Google Scholar
[5] Krivanek, O.L., Gubbens, A.J., Dellby, N., Meyer, C.E., Microsc. Microanl. Microstrut. 3, 187199 (1992).CrossRefGoogle Scholar
[6] Barbee, T.W. Jr., Jacobson, B.E. and Keith, D.L., Thin Solid Films 63, 143150 (1979).CrossRefGoogle Scholar
[7] Kelly, T.K., Cohen, M., Sande, J.B. Vander, Metallurgical Trans. A 15A, 819 (1984).Google Scholar
[8] Barbee, T.W., Wall, M.A., and Weihs, T., MRS Spring Meeting, 1993, Sym J To be published.Google Scholar
[9] Rivlin, V.G. and Raynor, G.V., International Metals Rev. 1, 21 (1980).Google Scholar