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Triple-probe Atomic Force Microscope: Measuring a carbon nanotube/DNA MIS-FET

Published online by Cambridge University Press:  11 February 2011

Kei Shimotani ,
Hiroyuki Watanabe ,
Chikara Manabe ,
Taishi Shigematsu  and
Masaaki Shimizu
Kei Shimotani
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Hiroyuki Watanabe
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Chikara Manabe
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Taishi Shigematsu
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
Masaaki Shimizu
Affiliation:
Ecology Research Lab., Corporate Research Laboratory, Fuji Xerox Co., Ltd. 430, Sakai, Nakai, Ashigarakami, Kanagawa, 259–0157, Japan
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Abstract

We have constructed an advanced electric probing system, which is a triple-probe atomic force microscope (T-AFM). The T-AFM consists of “Nanotweezers” and an AFM with a carbon nanotube probe. Using this system, we fabricated a single-walled carbon nanotubes (SWNTs)/deoxyribonucleic acid (DNA) three-terminal device and measured the current-voltage (I-V) curves of this device. In this three-terminal device, DNA strands were entangled with the SWNT bundle, and behaved as a gate-insulator-layer. This three-terminal device worked as a metal-insulator-semiconductor field effect transistor (MIS-FET) with depletion switching behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G14.3
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

Binnig, G., Rohrer, H., Gerber, Ch., and Weibel, E., Phys. Rev. Lett. 50, 120(1983).Google Scholar
2. Binnig, G., Quate, C. F., and Gerber, Ch., Phys. Rev. Lett. 56, 930(1986).Google Scholar
3. Watanabe, H., Manabe, C., Shigematsu, T., Shimotani, K., and Shimizu, M., Appl. Phys. Lett. 79, 2462 (2001).Google Scholar
4. Kim, P., and Lieber, C. M., Science 286, 2148 (1999).Google Scholar
5. Dai, H., Hafner, J. H., Rinzler, A. G., Colbert, D. T., and Smalley, R. E., Nature 384, 147 (1996).Google Scholar
6. Anazawa, K., Shimotani, K., Manabe, C., Watanabe, H., and Shimizu, M., Appl. Phys. Lett. 81, 739 (2002).Google Scholar
7. Collins, P. G., Arnold, M. S., and Avouris, Ph., Science 292, 706 (2001).Google Scholar