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Activation volume analysis of plastic deformation in fcc materials using nanoindentation

Published online by Cambridge University Press:  11 February 2011

A. A. Elmustafa ,
M. F. Tambwe  and
D. S. Stone
A. A. Elmustafa*
Affiliation:
NASA Langley Research Center- ConITS, Hampton, VA, USA
M. F. Tambwe
Affiliation:
Intel Corporation, Portland, OR, USA
D. S. Stone
Affiliation:
Department of Materials Science & Engineering, University of Wisconsin-Madison, Madison, WI, USA
*
* Corresponding author.
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Abstract

Activation volumes for plastic deformation of fcc metals are measured using nanoindentation. Materials include bulk, polycrystalline aluminum and α-brass, and sputtered copper and nickel thin films on silicon substrates. From a hardness measurement, V* is defined as 9k B T/∂H/∂ln , where H is the hardness and is a representative strain rate beneath the indenter. Data obtained using nanoindentation are consistent with those obtained using more conventional experiments based on uniaxial loading.

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References

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