Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-18T05:24:24.981Z Has data issue: false hasContentIssue false
  • English
  • Français

Anomalous Ultra-Small-Angle X-ray Scattering From Evolving Microstructures during Tensile Creep

Published online by Cambridge University Press:  10 February 2011

P. R. Jemian ,
G. G. Long ,
F. Lofaj  and
S. M. Wiederhorn
P. R. Jemian
Affiliation:
Materials Research Laboratory, University of Illinois at Urbana-Champaign, Bldg. 438D, Argonne, IL 60439, jemian@uiuc.edu National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8523
G. G. Long
Affiliation:
National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8523
F. Lofaj
Affiliation:
National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8523
S. M. Wiederhorn
Affiliation:
National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8523
Get access

Abstract

Ultra-small-angle x-ray scattering provides quantitative and statistically significant information on the size distribution of electron density inhomogeneities with dimensions between ≈100 Å and ≈5 μm. All sizes are sampled simultaneously with a single experiment, removing the possibility of observational bias. In a material such as commercial silicon nitride, where the inhomogeneities are due to populations of intergranular secondary phases and voids of similar dimensions, the scattering contains contributions from each individual population. A single USAXS scan cannot separate overlapping populations of scatterers due to the different contrasts of the microstructural components. Anomalous USAXS (A-USAXS) is an elementspecific contrast variation method to vary the scattering contribution from one of the populations while holding that of the other populations fixed. To follow the size evolution under tensile creep of both the cavities and the Yb disilicate secondary phases, A-USAXS data was measured near the Yb LIII absorption edge. Creep cavity and disilicate size distributions were each determined as a function of deformation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 131
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Luecke, W. E., Wiederhorn, S. M., Hockey, B. J., Krause, R. F. Jr, and Long, G. G., J Am Ceram Soc, 78, 2085–2096 (1995)10.1111/j.1151-2916.1995.tb08620.xGoogle Scholar
2. Lofaj, F., Okada, A., Usami, H., and Kawamoto, H., J Am Ceram Soc, 82, 1009–1019 (1999)10.1111/j.1151-2916.1999.tb01867.xGoogle Scholar
3. Luecke, W. E., and Wiederhorn, S. M., J Am Ceram Soc, 82, 2769–2778 (1999)10.1111/j.1151-2916.1999.tb02154.xGoogle Scholar
4. NGK Insulator Co., Ltd., Nagoya, JapanGoogle Scholar
5. The use of commercial designations or company names is for identification only and does not indicate endorsement by the National Institute of Standards and Technology.Google Scholar
6. Hoyt, J. J., Fontaine, D. de, and Warburton, W. K., J Appl Cryst, 17, 344–351 (1984)10.1107/S0021889884011626Google Scholar
7. Cromer, D. T., and Liberman, D., J Chem Phys, 53, 1891–1898 (1970)10.1063/1.1674266Google Scholar
8. Long, G. G., Allen, A. J., Ilavsky, J., Jemian, P. R., and Zschack, P., “The Ultra-Small-Angle x-ray Scattering Instrument on UNICAT” in 11th U.S. National Synchrotron Radiation Instrumentation Conference (SRI'99), edited by Pianetta, P., and Winick, H. New York: American Institute of Physics, 1999), pp. in press.Google Scholar
9. Long, G. G., Jemian, P. R., Weertman, J. R., Black, D. R., Burdette, H. E., and Spal, R., J Appl Cryst, 24, 30–37 (1991)10.1107/S0021889890009256Google Scholar
10. Lake, J. A., Acta Cryst, 23, 191–194 (1967)10.1107/S0365110X67002440Google Scholar
11. Jemian, P. R., Weertman, J. R., Long, G. G., and Spal, R. D., Acta Metall Mater, 39, 2477–2487(1991)10.1016/0956-7151(91)90062-6Google Scholar