Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-26T19:58:28.441Z Has data issue: false hasContentIssue false
  • English
  • Français

Broadband Antireflecting Conductive Metamaterial Films

Published online by Cambridge University Press:  10 August 2011

Nafiseh Pishbin ,
David Crouse ,
Igor Bendoym  and
Michael Crouse
Nafiseh Pishbin
Affiliation:
Department of Electrical Engineering, The City College of New York, 140th St. at Convent Ave, Steinman Hall, Room 614, New York, NY 10031
David Crouse
Affiliation:
Department of Electrical Engineering, The City College of New York, 140th St. at Convent Ave, Steinman Hall, Room 614, New York, NY 10031
Igor Bendoym
Affiliation:
Department of Electrical Engineering, The City College of New York, 140th St. at Convent Ave, Steinman Hall, Room 614, New York, NY 10031
Michael Crouse
Affiliation:
Phoebus Optoelectronics LLC, 12 Desbrosses St., New York, NY 10013
Get access

Abstract

A polarization-independent, broadband, antireflecting compound aperture array is designed, fabricated and characterized. The structure is composed of an aluminum film with a periodic array of perforations (apertures) configured in a square lattice with a unit cell consisting of two apertures with different diameters, both filled with silicon oxynitride. Light-channeling waveguide cavity modes of different energies are excited within the two different apertures within each unit cell thereby transmitting different parts of the solar spectrum into the substrate. Experimental characterization shows low reflection (<10%) and low diffuse backscatter. Numerous applications of the films include light detecting and emitting structures and devices.

Keywords

transparent conductornanostructureoptical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1325: Symposium E – Energy Harvesting—Recent Advances in Materials, Devices and Applications , 2011 , mrss11-1325-e05-03
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ebbesen, T. W., Lezec, H. J., Ghaemi, H. F., Thio, T. and Wolff, P. A., Nature 391, 667 (1998).Google Scholar
2. Grupp, D.E., Lezec, H.J., Thio, T. and Ebbesen, T.W., Advanced Materials 11, 860 (1999).Google Scholar
3. Treacy, M. M. J., Phys. Rev. B 66, 195105 (2002).Google Scholar
4. Crouse, D. and Keshavareddy, P., Opt. Express 20, 7760 (2005).Google Scholar
5. Crouse, D., IEEE Trans. Electron Devices 52, 2365 (2005).Google Scholar
6. Crouse, D. and Keshavareddy, P., J. Opt. A: Pure Appl. Opt. 8, 175 (2006).Google Scholar
7. Crouse, D. and Keshavareddy, P., Opt. Express 15, 1415 (2007).Google Scholar
8. Yang, Fuzi and Roy Sambles, John, J. Phys. D: Appl. Phys. 35 3049 (2002).Google Scholar
9. Hibbins, Alastair P., Hooper, Ian R., Lockyear, Matthew J., and Sambles, J.R., Phys. Rev. Lett. 96, 257402 (2006).Google Scholar
10. Crouse, David, Jaquay, Eric, Maikal, Abdur, Hibbins, Alastair P., Phys. Rev. B 77, 195437 (2008).Google Scholar
11. Ye, Yong-Hong, Wang, Zhi-Bing, Yan, Desheng, Zhang, Jia-Yu, App. Phys. Lett. 89, 221108 (2006)Google Scholar