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The Effects of Microstructure on the Brightness of Pulsed Laser Deposited Y2O3:Eu Thin Film Phosphors for Field Emission Displays

Published online by Cambridge University Press:  14 March 2011

K. G. Cho ,
R. K. Singh ,
D. Kumar ,
P. H. Holloway ,
H-J. Gao ,
S. J. Pennycook ,
G. Russell  and
B. K. Wagner
K. G. Cho
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
R. K. Singh
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
D. Kumar
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
P. H. Holloway
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611.
H-J. Gao
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030.
S. J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030.
G. Russell
Affiliation:
PTCOE, Georgia Institute of Technology, Manufacturing Research Center, Atlanta, GA 30332.
B. K. Wagner
Affiliation:
PTCOE, Georgia Institute of Technology, Manufacturing Research Center, Atlanta, GA 30332.
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Abstract

In order to investigate the effect of microstructure on the brightness of thin film phosphors for field emission displays, Y2O3:Eu thin film phosphors were prepared using pulsed laser deposition. To deconvolute the effects experimentally, the Y2O3:Eu films of controlled thickness and microstructure were prepared on various substrate materials such as amorphous quartz, (0001) sapphire, (100) lanthanum aluminate (LaAlO3), and (100) silicon wafers. Cathodoluminescent brightness and efficiency of the films were obtained in both transmission and reflection modes. The Y2O3:Eu films deposited on the quartz substrates showed the maximum brightness followed by the films on (0001) sapphire, (100) lanthanum aluminate (LaAlO3), and (100) silicon substrates. The role of interface scattering of the emitted light on the film brightness will be discussed together with changing surface roughness and film thickness.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 621: Symposia Q/R – Electron-Emissive Materials, Vacuum Microelectronics… , 2000 , Q2.10.1
Copyright
Copyright © Materials Research Society 2000

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References

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