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Imaging Self-Organized Domains at the Micron Scale in Antiferromagnetic Elemental Cr Using Magnetic X-ray Microscopy

Published online by Cambridge University Press:  17 March 2011

P. G. Evans ,
E. D. Isaacs ,
G. Aeppli ,
Z.-H. Cai  and
B. Lai
P. G. Evans
Affiliation:
Bell Laboratories, Lucent Technologies, 600-700 Mountain Ave., Murray Hill, NJ 07974
E. D. Isaacs
Affiliation:
Bell Laboratories, Lucent Technologies, 600-700 Mountain Ave., Murray Hill, NJ 07974
G. Aeppli
Affiliation:
NEC Research Institute, 4 Independence Way, Princeton, NJ 08540
Z.-H. Cai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
B. Lai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
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Abstract

The domains of antiferromagnetic order in elemental chromium can be observed with spatial resolution that is improved by orders of magnitude in comparison with previous techniques using magnetic x-ray scattering with an incident x-ray beam focused to a submicron spot. This use of magnetic x-ray microscopy takes advantage of the incommensurate spin density wave order in Cr to isolate magnetic scattering. The spin polarization dependence of the magnetic x-ray scattering cross section allows the first order spin-flip transition near 120 K to be imaged directly.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 690: Symposium F – Spintronics , 2001 , F8.6
Copyright
Copyright © Materials Research Society 2002

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References

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