Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-19T18:00:41.099Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical and Electrical Characterization of Copper-and Chlorine-Doped Cadmium Zinc Telluride

Published online by Cambridge University Press:  10 February 2011

J. E. Toney ,
B. A. Brunett ,
T. E. Schlesinger ,
E. Cross ,
F. P. Doty  and
R. B. James
J. E. Toney
Affiliation:
Department of Physics
B. A. Brunett
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
T. E. Schlesinger
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
E. Cross
Affiliation:
Sandia National Laboratories, Livermore, CA 94550
F. P. Doty
Affiliation:
Digirad Corp., San Diego, CA 92121
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA 94550
Get access

Abstract

We have used low-temperature photoluminescence spectroscopy and photo-induced current transient spectroscopy to study the properties of copper-doped Cd1−xZnxTe with x=0.1 and chlorine-doped Cd1−xZnxTe with x=0.2, 0.35 and 0.5. The current-voltage characteristics and detector response were also measured. We observed variations in charge collection and resistivity in the Cu-doped samples which was correlated with variations in PICTS spectra. The Cl-doped material was found to have insufficient resistivity for detector operation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 59
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hjelt, K., Juvonen, M., Tuomi, T., Nenonen, S., Eissler, E.E. and Bavdaz, M., phys. stat. sol (a) 162, p. 747 (1997) and references therein.Google Scholar
2. Biglari, B., Samimi, M., Hage-Ali, M., Koebel, J.M. and Siffert, P., Nucl. Instr. Meth. A 283, p. 249 (1989).Google Scholar
3. Fiederle, M., Ebling, D., Eiche, C., Hofmann, D.M., Salk, M., Stadler, W., Benz, K.W., Meyer, B.K., J. Crystal Growth 138, p. 529 (1994).Google Scholar
4. Hoffman, D.M., Stadler, W., Oettinger, K., Meyer, B.K., Omling, P., Salk, M., Benz, K.W., Weigel, E. and Muller-Vogt, G., Mats. Sci. Eng. B 16, p. 128 (1993).Google Scholar