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Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-Ray Diffraction Study

Published online by Cambridge University Press:  10 February 2011

A. Judy
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853
M.V. Ramana Murty
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853
E. Butler
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853
J. Pomeroy
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853
B.H. Cooper
Affiliation:
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853
A.R. Woll
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
J.D. Brock
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
S. Kycia
Affiliation:
Cornell High Energy Synchrotron Source(CHESS), Wilson Laboratory, Ithaca, New York 14853
R.L. Headrick
Affiliation:
Cornell High Energy Synchrotron Source(CHESS), Wilson Laboratory, Ithaca, New York 14853
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Abstract

Using Scanning Tunneling Microscopy(STM) and X-ray diffraction(XRD), we have studied the development of surface roughness on Au(111) during 500eV Ar+ ion irradiation at different angles. During normal incidence erosion the surface roughens and pattern formation occurs. The surface morphology is a mixture of mounds and pits superimposed onto a larger structure of channels and valleys. The characteristic spacing between features grows with a power law behavior t27, where t is the amount of time the sample was irradiated, in agreement with previous measurements[l]. At glancing angles, erosion proceeds smoothly, but not in layer-by-layer fashion. Finally, a combination of glancing angle and normal incidence erosion is used to create a rippled morphology

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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