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Scanning Acoustic Microscopy and x-ray Diffraction Investigation of Near Crack Tip Stresses

Published online by Cambridge University Press:  10 February 2011

S. Sathish  and
R. W. Martin
S. Sathish
Affiliation:
University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0127
R. W. Martin
Affiliation:
University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0127
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Abstract

Scanning Acoustic Microscopy has been used to measure and map the Rayleigh wave velocity and the Surface Skimming Longitudinal wave velocities near a crack tip in a sample of Ti-6AI-4V. X-ray diffraction measurements have been performed to map the stress in the same region of the sample. The differences in the contrast between the two acoustic velocity images and their sensitivity to stress are examined. Similarities between x-ray stress images and acoustic velocity images are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999 , 55
Copyright
Copyright © Materials Research Society 2000

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References

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