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An empirical derivation of the X-ray optic transmission profile used in calibrating the Planetary Instrument for X-ray Lithochemistry (PIXL) for Mars 2020

Published online by Cambridge University Press:  24 May 2018

C. M. Heirwegh ,
W. T. Elam ,
D. T. Flannery  and
A. C. Allwood
C. M. Heirwegh*
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
W. T. Elam
Affiliation:
Applied Physics Laboratory, University of Washington, Seattle, Washington
D. T. Flannery
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
A. C. Allwood
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
*
a)Author to whom correspondence should be addressed. Electronic mail: christopher.m.heirwegh@jpl.nasa.gov
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Abstract

Calibration of the prototype Planetary Instrument for X-ray Lithochemistry (PIXL) selected for Mars 2020 has commenced with an empirical derivation of the X-ray optic transmission profile. Through a straightforward method of dividing a measured “blank” spectrum over one calculated assuming no optic influence, a rudimentary profile was formed. A simple boxcar-smoothing algorithm was implemented to approximate the complete profile that was incorporated into PIQUANT. Use of this form of smoothing differs from the more conventional approach of using a parameter-based function to complete the profile. Comparison of element-specific correction factors, taken from a measurement of NIST SRM 610, was used to assess the accuracy of the new profile. Improvement in the low- to mid-energy portion of the data was apparent though the high-energy region diverged from unity, and thus, requires further refinement.

Keywords

PIXLMARS 2020optic transmissionX-ray lithochemistryempirical derivation
Type
Technical Article
Information
Powder Diffraction , Volume 33 , Issue 2 , June 2018 , pp. 162 - 165
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Copyright
Copyright © International Centre for Diffraction Data 2018 

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References

Allwood, A. C., Wade, L., Clark, B., Elam, T., Flannery, D., Foote, M., Hurowitz, J., and Knowles, E. (2015) “Texture-specific elemental analysis of rocks and soils with PIXL: The Planetary Instrument for X-ray Lithochemistry on Mars 2020,” Proceedings of IEEE Aerospace Conference 2015, Piscataway, New Jersey, March 7–14, 2015.Google Scholar
Campbell, J. L., McDonald, L., Hopman, T., and Papp, T. (2001) “Simulations of Si(Li) x-ray detector response,” X-ray Spectrom., 30, 230–241.Google Scholar
Eggert, T., Boslau, O., Kemmer, J., Pahlke, A., and Wiest, F. (2006) “The spectral response of silicon X-ray detectors,” Nucl. Instrum. Methods A, 568, 1–11.Google Scholar
Elam, W. T., Ravel, B. D., and Sieber, J. R. (2002) “A new atomic database for X-ray spectroscopic calculations,” Radiat. Phys. Chem., 63, 121–128.CrossRefGoogle Scholar
Hodoroaba, V. and Procop, M. (2009) “Determination of the real transmission of an X-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra,” X-ray Spectrom., 38, 216–221.Google Scholar
Lowe, B. G. (2000) “An analytical description of low-energy X-ray spectra in Si(Li) and HPGE detectors,” Nucl. Instrum. Methods A, 439, 247–261.CrossRefGoogle Scholar
Papp, T. (2003) “On the response function of solid-state detectors, based on energetic electron transport processes,” X-ray Spectrom., 32, 458–469.Google Scholar
Pearce, N. J. G., Perkins, W. T., Westgate, J. A., Gorton, M. P., Jackson, S. E., Neal, C. R., and Chenery, S. P. (1997) “A compilation of new and published major and trace element data for NIST SRM 610 and NIST SRM 612 glass reference materials,” Geostandard. Newslett., 21, 115–144.Google Scholar
Scholze, F. and Procop, M. (2009) “Modelling the response function of energy dispersive X-ray spectrometers with silicon detectors,” X-ray Spectrom., 38, 312–321.Google Scholar
Wolff, T., Malzer, W., Mantouvalou, I., Hahn, O., and Kanngieβer, B. (2011) “A new fundamental parameter based calibration procedure for micro X-ray fluorescence spectrometers,” Spectrochim. Acta B, 66, 170–178.Google Scholar