Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T12:47:59.568Z Has data issue: false hasContentIssue false
  • English
  • Français

C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials

Published online by Cambridge University Press:  20 May 2016

F. A. Selim ,
D. P. Wells ,
J. F. Harmon  and
J. Kwofie
F. A. Selim
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
D. P. Wells
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
J. F. Harmon
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
J. Kwofie
Affiliation:
Idaho State University, Idaho Accelerator Center, Pocatello, ID
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 179
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)