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Characterization and Rietveld refinements of new dense ceramics Ba3−xSrxTb3−xCexO9 (x = 1 and 1.5) perovskites

Published online by Cambridge University Press:  31 January 2020

Yali Su ,
Dayong Lu Open the ORCID record for Dayong Lu [Opens in a new window]  and
Shan Wang
Yali Su
Affiliation:
Key Laboratory for Special Functional Materials in Jilin Provincial Universities, Jilin Institute of Chemical Technology, Jilin132022, China College of Chemistry, Jilin University, Changchun130012, China
Dayong Lu*
Affiliation:
Key Laboratory for Special Functional Materials in Jilin Provincial Universities, Jilin Institute of Chemical Technology, Jilin132022, China
Shan Wang
Affiliation:
Key Laboratory for Special Functional Materials in Jilin Provincial Universities, Jilin Institute of Chemical Technology, Jilin132022, China
*
a)Author to whom correspondence should be addressed. Electronic mail: dylu@jlict.edu.cn
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Abstract

Ba3−xSrxTb3−xCexO9 (x = 1 and 1.5) ceramics (BSTC) with a relative density of 93% and a grain size distribution of 0.2–3 µm were prepared by the mixed-oxides reaction route. The crystalline structures, microstructures, valence states, and electrical properties of two ceramics were analyzed using X-ray powder diffraction (XRPD), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), electron paramagnetic resonance (EPR), and electrical measurements. Rietveld analyses of XRPD patterns show that BSTC1 is indexed as a trigonal structure with the space group R-3c, and BSTC3/2 is indexed as an orthorhombic perovskite structure with the space group Pmcn. The EPR, XPS, and electrical conductivity results confirm that Ce and Tb ions in BSTC exist as Ce4+ and mixed-valence states of Tb4+/Tb3+, respectively. At room temperature, the two BSTC ceramics exhibit a similar semiconducting behavior. The relationships between electrical conductivity and temperature/frequency are provided. The defect chemistry is discussed.

Keywords

Ba2SrTb2CeO9 and Ba1.5Sr1.5Tb1.5Ce1.5O9X-ray powder diffractionelectric propertieselectron paramagnetic resonanceX-ray photoelectron spectroscopy
Type
Technical Article
Information
Powder Diffraction , Volume 35 , Issue 1 , March 2020 , pp. 23 - 30
Copyright
Copyright © International Centre for Diffraction Data 2020

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