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Characterization of standard reference materials for obtaining instrumental line profiles

Published online by Cambridge University Press:  10 January 2013

Matteo Leoni ,
Paolo Scardi  and
J. Ian Langford
Matteo Leoni
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, via Mesiano, 77, 38050 Trento, Italy
Paolo Scardi
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, via Mesiano, 77, 38050 Trento, Italy
J. Ian Langford
Affiliation:
School of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, UK
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Abstract

Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.

Keywords

standard reference materials (SRMs)line-profile analysissample transparencysynchrotron radiation
Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 4 , December 1998 , pp. 210 - 215
Copyright
Copyright © Cambridge University Press 1998

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