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D-60 Invited—Determination of Crystallographic Polarity of Thin Films Using High Resolution XRD

Published online by Cambridge University Press:  20 May 2016

K. Inaba
K. Inaba
Affiliation:
Rigaku Corporation, Tokyo, Japan
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 173
Copyright
Copyright © Cambridge University Press 2008

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