Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T10:48:00.381Z Has data issue: false hasContentIssue false
  • English
  • Français

Genie: new software for rapid submission of powder diffraction data to the ICDD powder diffraction file™

Published online by Cambridge University Press:  10 November 2014

Diane E. Sagnella  and
Emily Foster
Diane E. Sagnella*
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania
Emily Foster
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania
*
a) Author to whom correspondence should be addressed. Electronic mail: sagnella@icdd.com
Get access Rights & Permissions [Opens in a new window]

Abstract

A new software application has been developed to provide a convenient method for the submission of diffraction data directly to the International Centre for Diffraction Data, for inclusion in the Powder Diffraction File (PDF)™. The application, titled Genie, acts as a portal for the merging of data from separate sources allowing the user to quickly and easily submit their data for the PDF. Using Java Web Start technology Genie can be run using all common computer platforms. Genie is flexible and can be used to read a variety of common file formats. Furthermore, Genie can also be used for submission of New Diffraction Data for publication in the Powder Diffraction Journal.

Keywords

PDFPowder DiffractionJava Web Start
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Supplement S2 , December 2014 , pp. S31 - S34
Check for updates
Copyright
Copyright © International Centre for Diffraction Data 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bish, D. L. and Howard, S. A. (1988). “Quantitative phase analysis using the rietveld method,” J. Appl. Crystallogr. 21, 86–91.CrossRefGoogle Scholar
Hanawalt, J. D. (1983). History of the Powder Diffraction File, in Crystallography in North America – Apparatus and Methods, ch. 2, pp 215–219. American Crystallographic Association, New York, NY.Google Scholar
ICDD (2013). PDF4+ 2013 (Database), edited by Dr. Kabekkodu, Soorya, International Centre for Diffraction Data, Newtown Square, PA, USA.Google Scholar
ICDD (2014). PDF4+ 2014 (Database), edited by Dr. Kabekkodu, Soorya, International Centre for Diffraction Data, Newtown Square, PA, USA.Google Scholar
Rietveld, H. M. (1969). “A profile refinement for nuclear and magnetic structures,” J. Appl. Crystallogr. 2, 65–71. doi: 10.1107/S0021889869006558 CrossRefGoogle Scholar