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Introduction to two-dimensional X-ray diffraction

Published online by Cambridge University Press:  06 March 2012

Bob Baoping He
Bob Baoping He*
Affiliation:
Bruker Advanced X-ray Solutions, Inc., 5465 East Cheryl Parkway, Madison, Wisconsin 53711
*
a)Electronic mail: bhe@bruker-axs.com
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Abstract

Two-dimensional X-ray diffraction refers to X-ray diffraction applications with two-dimensional detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take advantage of two-dimensional diffraction, new theories and approaches are necessary to configure the two-dimensional X-ray diffraction system and to analyze the two-dimensional diffraction data. This paper is an introduction to some fundamentals about two-dimensional X-ray diffraction, such as geometry convention, diffraction data interpretation, and advantages of two-dimensional X-ray diffraction in various applications, including phase identification, stress, and texture measurement.

Type
Two-Dimensional Detectors
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 71 - 85
Copyright
Copyright © Cambridge University Press 2005

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