Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T12:46:48.076Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of the microstructure of energetic crystals by means of X-ray powder diffraction

Published online by Cambridge University Press:  01 March 2012

Michael Herrmann  and
Harald Fietzek
Michael Herrmann
Affiliation:
Fraunhofer Institut für Chemische Technologie, Pfinztal, Germany
Harald Fietzek
Affiliation:
Fraunhofer Institut für Chemische Technologie, Pfinztal, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

Mechanical sensitivity of energetic materials is discussed as a function of particle size and lattice defects. Therefore an approach is made to quantify and characterize lattice defects of the energetic powders RDX and HMX using X-ray diffraction. The mechanical properties of these cyclic nitramines are supposed to be dominated by different defect mechanisms—deformation twinning and dislocation slip. The energetic powders and the line-shape standard SRM 660a (NIST) were measured on a Bragg-Brentano diffractometer D5000 (Bruker-AXS), and the diffraction patterns were evaluated by Rietveld- and peak-profile analysis using Williamson-Hall plots. Additionally, preparing samples as thin powder layers was tested in order to reduce line broadening due to low absorption. The investigations reveal interesting details. Characteristic line broadening was found for RDX and HMX pointing to a comparably higher microstrain in HMX. Anisotropic line broadening was found for RDX and discussed in terms of strain fields of dislocations.

Type
XRD Characterization
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 105 - 108
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Armstrong, R. W., Ammon, H. L., Du, Z. Y., Elban, W. L., and Zhang, X. J. (1993). Mater. Res. Soc. Symp. Proc. MRSPDH 296, 227–232.CrossRefGoogle Scholar
Choi, C. S. and Boutin, H. P. (1970). Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. ACBCAR 10.1107/S0567740870003941 B26, 1235–1240.CrossRefGoogle Scholar
Choi, C. S. and Prince, E. (1972). Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. ACBCAR 10.1107/S0567740872007046 B28, 2857–2862.CrossRefGoogle Scholar
Heijden, A. E. D. M. v. d. and Bouma, R. H. B. (1998). Proc. 29th Int. Annual Conf. of ICT, 65∕1-65∕11.Google Scholar
Kröber, H., Teipel, U., Leisinger, K., and Krause, H. (1998). Proc. 29th Int. Annual Conf. of ICT, 66∕1-65∕18.Google Scholar
National Institute of Standards and Technology (2000). NIST Certificate of SRM 660a (Gaithersburg, MD).Google Scholar
Palmer, S. J. P. and Field, J. E. (1982). Proc. R. Soc. London PRLAAZ A383, 399–402.Google Scholar
Ungár, T. (2000). Industrial Application of X-ray Diffraction, edited by Chung, F. H., and Smith, D. K.Google Scholar
Warren, B. E. and Averbach, B. L. (1950). J. Appl. Phys. JAPIAU 10.1063/1.1699713 21, 595–599.CrossRefGoogle Scholar
Williamson, G. K. and Hall, W. H. (1953). Acta Metall. AMETAR 10.1016/0001-6160(53)90006-6 1, 22–31.CrossRefGoogle Scholar