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A Method for Quantitative Phase Analysis of Silicon Nitride by X-Ray Diffraction

Published online by Cambridge University Press:  10 January 2013

David J. Devlin  and
Kamal E. Amin
David J. Devlin
Affiliation:
Norton Company, Advanced Ceramics, Northboro, Massachusetts, U.S.A.
Kamal E. Amin
Affiliation:
Norton Company, Advanced Ceramics, Northboro, Massachusetts, U.S.A.
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Abstract

The relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.

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Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 3 , September 1990 , pp. 121 - 124
Copyright
Copyright © Cambridge University Press 1990

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References

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