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Reliability of Commonly Used Versions of the Powder Diffraction File PDF-2

Published online by Cambridge University Press:  10 January 2013

A. Drummond  and
D.G. Hay
A. Drummond
Affiliation:
State Electricity Commission of Victoria, Herman Research Laboratories, Howard Street, Richmond, Victoria,Australia3121
D.G. Hay*
Affiliation:
CSIRO Division of Materials Science and Technology, Locked Bag 33, Clayton, Victoria,Australia3168
*
*Author to whom correspondence should be addressed
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Abstract

Use of the program NBS*AIDS83 to modify data in the ICDD Powder Diffraction File (PDF) has led to substantial changes in card entries for Sets 1-33, in contrast to the previous policy of the International Centre for Diffraction Data of republishing cards where data has been significantly altered. Further changes to data have been revealed in the use of the database with the Philips PLUS 37 search and retrieval system.

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 3 , September 1990 , pp. 146 - 151
Copyright
Copyright © Cambridge University Press 1990

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References

Blachnik, R., Lasocka, M. & Walbrecht, U. (1983). J. Solid Slate Chem. 48, 431–438.CrossRefGoogle Scholar
Jenkins, R. & Holomany, M. (1987). Powder Diffr. 2, 215–219.CrossRefGoogle Scholar
Jenkins, R., Holomany, M. & Wong-Ng, W. (1987). Powder Diffr. 2, 84–87.Google Scholar
McCarthy, G.J. (1989). ICDD Methods and Practices Manual, 7.21-7.22. Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
Smith, G.S. & Snyder, R.L. (1979). J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Wolff, P.M. de (1968). J. Appl. Crystallogr. 1, 108–113.CrossRefGoogle Scholar
Wong-Ng, W., Holomany, M., McClune, W.F. & Hubbard, C.R. (1982). In Adv. X-Ray Anal. 26, 87–88. New York: Plenum.Google Scholar