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Synthesis of cerium oxide (CeO2) by co-precipitation for application as a reference material for X-ray powder diffraction peak widths

Published online by Cambridge University Press:  21 January 2018

Anderson Márcio de Lima Batista ,
Marcus Aurélio Ribeiro Miranda Open the ORCID record for Marcus Aurélio Ribeiro Miranda [Opens in a new window] ,
Fátima Itana Chaves Custódio Martins ,
Cássio Morilla Santos  and
José Marcos Sasaki
Anderson Márcio de Lima Batista*
Affiliation:
Departamento de Engenharia Metalúrgica e de Materiais, Centro de Tecnologia, Universidade Federal do Ceará – UFC, 60455-760, Fortaleza, CE, Brazil
Marcus Aurélio Ribeiro Miranda
Affiliation:
Departamento de Física, Centro de Ciências, Universidade Federal do Ceará – UFC, 60440-970, Fortaleza, CE, Brazil
Fátima Itana Chaves Custódio Martins
Affiliation:
Departamento de Química Analítica e Físico-Química, Centro de Ciências, Universidade Federal do Ceará – UFC, 60455-700, Fortaleza, CE, Brazil
Cássio Morilla Santos
Affiliation:
Departamento de Física, Centro de Ciências, Universidade Federal do Ceará – UFC, 60440-970, Fortaleza, CE, Brazil
José Marcos Sasaki
Affiliation:
Departamento de Física, Centro de Ciências, Universidade Federal do Ceará – UFC, 60440-970, Fortaleza, CE, Brazil
*
a)Author to whom correspondence should be addressed. Electronic mail: andersondmlb@gmail.com
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Abstract

Several methods can be used to obtain, from powder diffraction patterns, crystallite size and lattice strain of polycrystalline samples. Some examples are the Scherrer equation, Williamson–Hall plots, Warren/Averbach Fourier decomposition, Whole Powder Pattern Modeling, and Debye function analysis. To apply some of these methods, it is necessary to remove the contribution of the instrument to the widths of the diffraction peaks. Nowadays, one of the main samples used for this purpose is the LaB6 SRM660b commercialized by the National Institute of Standard Technology; the width of the diffraction peak of this sample is caused only by the instrumental apparatus. However, this sample can be expensive for researchers in developing countries. In this work, the authors present a simple route to obtain micron-sized polycrystalline CeO2 that have a full width at half maximum comparable with the SRM660b and therefore it can be used to remove instrumental broadening.

Keywords

X-ray diffractionstandard reference materialcerium oxideinstrumental broadening
Type
Technical Articles
Information
Powder Diffraction , Volume 33 , Issue 1 , March 2018 , pp. 21 - 25
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Copyright
Copyright © International Centre for Diffraction Data 2018 

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