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Unit cell expansion in ErT2 films

Published online by Cambridge University Press:  01 March 2012

Mark A. Rodriguez
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
James F. Browning
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Colleen S. Frazer
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Clark S. Snow
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Ralph G. Tissot
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Elaine P. Boespflug
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411

Abstract

XRD analysis of plasma-vapor-deposited ErT2 films during aging (T decay to 3He) reveals an hkl-dependent unit-cell expansion in which (200) grains expand out-of-plane as much as 0.01 Å more than (111) out-of-plane grains. Texture analysis of an aged ErT2 film reveals a bimodal (111)/(200) out-of-plane preferred orientation. sin2 ψ analysis reveals significant in-plane macro-strain due to 3He bubble formation/growth. The mechanistic origins regarding these observations are also discussed.

Type
X-RAY DIFFRACTION AND RELATED TECHNIQUES
Copyright
Copyright © Cambridge University Press 2007

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