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X-ray diffraction characterization of the microstructure of close-packed hexagonal nanomaterials

Published online by Cambridge University Press:  29 February 2012

Zhao-hui Pu ,
Chuan-zheng Yang ,
Pei Qin ,
Yu-wan Lou  and
Li-fang Cheng
Zhao-hui Pu
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Chuan-zheng Yang
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Pei Qin
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Yu-wan Lou
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Li-fang Cheng
Affiliation:
National Engineering and Research Center for Nanotechnology, Shanghai 200237, China
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Abstract

A general least-squares technique for X-ray diffraction line broadening analysis has been developed. The technique can be used to determine single, double, and triple line broadening effects caused by small particle sizes, microstrain, stacking faults, or all three presented in a closed-packed hexagonal nanomaterial. The technique was applied to characterize the microstructure of β-Ni(OH)2, a negative electrode material in nickel-metal hydride (NiMH) batteries. Double line broadening effects caused by both small crystallite sizes and stacking faults in β-Ni(OH)2 were detected and analyzed. Triple line broadening effects caused simultaneously by small crystallite sizes, microstrain, and stacking faults were detected in β-Ni(OH)2 after activation and charge-discharge cycle tests. The triple line broadening effects were found to be selective and most pronounced for diffraction lines with h−k=3n±1. The broadening effects were larger when l=even, but smaller when l=odd. The shape and the average size of the crystallites, microstrain, and stacking fault probability in β-Ni(OH)2 changed dramatically after activation and charge-discharge cycles. The method was also applied to characterize and investigate the microstructure of nano ZnO materials. Results indicate that no selective broadening appears in the XRD patterns of the nano ZnO materials. The average crystallite sizes were different slightly, and the stacking fault probabilities differed significantly with different dopants.

Keywords

nanomaterialsβ-Ni(OH)2ZnOX-ray line broadening effects
Type
TECHNICAL ARTICLES
Information
Powder Diffraction , Volume 23 , Issue 3 , September 2008 , pp. 213 - 223
Copyright
Copyright © Cambridge University Press 2008

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