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X-ray powder diffraction data for δ-Na2Si2O5

Published online by Cambridge University Press:  10 January 2013

V. Kahlenberg ,
M. Wendschuh-Josties ,
R. X. Fischer ,
H. Bauer ,
J. Holz ,
G. Schimmel  and
A. Tapper
V. Kahlenberg
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
M. Wendschuh-Josties
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
R. X. Fischer
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
H. Bauer
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
J. Holz
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
G. Schimmel
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
A. Tapper
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
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Abstract

The X-ray powder diffraction data for δ-Na2Si2O5 are reported. The sample was prepared from water glass solution applied to pressed powder tablets of finely ground quartz using a heating program with a maximal temperature of 700 °C. The crystallographic data for δ-disilicate obtained from a Rietveld analysis are: space group P21/n, a=8.3818(4) Å, b=12.0726(5) Å, c=4.8455(2) Å, β=90.303(5)°, V=490.31 Å3, Z=4, and Dcalc.=2.468 g/cm3.

Type
New Diffraction Data
Information
Powder Diffraction , Volume 15 , Issue 2 , June 2000 , pp. 139 - 141
Copyright
Copyright © Cambridge University Press 2000

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References

Caglioti, G., Paoletti, A., and Ricci, F. P. (1958). “Choice of collimators for a crystal spectrometer for neutron diffraction,” Nucl. Instrum. Methods 3, 223–228.CrossRefGoogle Scholar
de Wolff, P. M. (1968). “A simplified criterion for the reliability of a powder pattern indexing,” J. Appl. Crystallogr. 1, 108–113.CrossRefGoogle Scholar
Fischer, R. X., Lengauer, C. L., Tillmanns, E., Ensink, R. J., Reiss, C. A., and Fantner, E. J. (1993). PC-Rietveld Plus, a comprehensive Rietveld analysis package for PC. Materials Science Forum, 133–136, 287–292.CrossRefGoogle Scholar
Hoffmann, W., and Scheel, H. J. (1969). “Über die γ-und δ-Modifikationen des Natriumdisilikates, Na 2Si 2O 5,”Z. Kristallogr. 129, 396–404.Google Scholar
Kahlenberg, V., Dörsam, G., Wendschuh-Josties, M., and Fischer, R. X. (1999). “The crystal structure of δ-Na 2Si 2O 5,”J. Solid State Chem. 146, 380–386.Google Scholar
Pant, A. K., and Cruickshank, D. W. J. (1968). “The crystal structure of α-Na 2Si 2O 5,”Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. 24, 13–19.CrossRefGoogle Scholar
Smith, G. S., and Snyder, R. L. (1979). “F(N): A criterion for rating powder diffraction patterns and evaluating the reliability of powder pattern indexing,” J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Wilkens, J. (1995). “Structure-property relationships of sodium disilicates,” Tenside Surfractants Detergents 32, 475–481.Google Scholar
Willgallis, A., and Range, K. J. (1963). “Zur Polymorphie des Na 2Si 2O 5,”Glastech. Ber. 37, 194–200.Google Scholar
Williamson, J., and Glasser, F. P. (1966). “The crystallisation of Na 2O.2SiO 2-SiO 2 glasses,” Phys. Chem. Glasses 7, 127–138.Google Scholar
Zachariasen, W. H., and Plettinger, H. A. (1965). “Extinction in quartz,” Acta Crystallogr. 18, 710–714.CrossRefGoogle Scholar