Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Ballard, B. L.
Predecki, P. K.
and
Braski, D. N.
1993.
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD).
Advances in X-ray Analysis,
Vol. 37,
Issue. ,
p.
189.
Eatough, Michael O.
and
Gochner, Raymond P.
1993.
The Effects of Using Long Soller Slits as “Parallel Beam Optics” for Gixrd on Diffraction Data.
Advances in X-ray Analysis,
Vol. 37,
Issue. ,
p.
167.
van der Sluis, P.
1994.
Peaks in the background from single-crystal substrates measured with parallel beam optics.
Powder Diffraction,
Vol. 9,
Issue. 3,
p.
168.
Ballard, B. L.
Predecki, P. K.
and
Braski, D. N.
1994.
Advances in X-Ray Analysis.
p.
189.
Eatough, Michael O.
and
Goehner, Raymond P.
1994.
Advances in X-Ray Analysis.
p.
167.
Keller, L
and
Rey-Fessler, P
1994.
Characterization and Performance of Calcium Phosphate Coatings for Implants.
p.
54.
Vaia, Richard A.
Weathers, Maura S.
and
Bassett, William A.
1994.
Anomalous peaks in grazing incidence thin film X-ray diffraction.
Powder Diffraction,
Vol. 9,
Issue. 1,
p.
44.
Ballard, B. L.
Zhu, X.
Predecki, P. K.
Albin, D.
Gabor, A.
Tuttle, J.
and
Noufi, R.
1995.
Advances in X-Ray Analysis.
p.
269.
Toraya, H.
and
Yoshino, J.
1995.
A Polycrystalline Thin Film Diffractometer for Asymmetric Diffraction Using Parallel Beam and High Resolution Parallel Slits.
Advances in X-ray Analysis,
Vol. 39,
Issue. ,
p.
165.
Pardo, L.
Calzada, M.L.
Milne, S.J.
Ricote, J.
and
Jimenez, B.
1995.
Microstructure development of diol-based sol-gel processed lead titanate thin films.
Journal of Physics and Chemistry of Solids,
Vol. 56,
Issue. 1,
p.
15.
Toraya, H.
and
Okuda, T.
1995.
Crystal structure analysis of polycrystalline Bi3Fe5O12 thin film by using asymmetric and symmetric diffraction techniques.
Journal of Physics and Chemistry of Solids,
Vol. 56,
Issue. 10,
p.
1317.
Knotter, D.Martin
1996.
Application and properties of sub-monomolecular layers of silicon dioxide deposited under mild conditions.
Applied Surface Science,
Vol. 99,
Issue. 2,
p.
99.
1996.
Introduction to X‐ray Powder Diffractometry.
p.
173.
Drewien, C. A.
Tallant, D. R.
and
Eatough, M. O.
1996.
Thermal stability and decomposition kinetics of Li2Al4CO3(OH)12·3H2O.
Journal of Materials Science,
Vol. 31,
Issue. 16,
p.
4321.
Rodriguez, Mark A.
Boyle, Timothy J.
Hernandez, Bernadette A.
Buchheit, Catherine D.
and
Eatough, Michael O.
1996.
Formation of SrBi2Ta2O9: Part II. Evidence of a bismuth-deficient pyrochlore phase.
Journal of Materials Research,
Vol. 11,
Issue. 9,
p.
2282.
Mendiola, J.
Calzada, M. L.
Sirera, R.
and
Ramos, P.
1996.
Structure and ferroelectric properties dependence on thermal treatment of modified lead titanate thin films.
Journal of Materials Science,
Vol. 31,
Issue. 3,
p.
617.
Rodriguez, Mark A.
Boyle, Timothy J.
Buchheit, Catherine D.
Tissot, Raplh G.
Drewen, Celeste A.
Hernandez, Bernadette A.
and
Eatough, Michael O.
1997.
Phase formation and characterization of the SrBi2Ta2O9 layered-perovskite ferroelectric.
Integrated Ferroelectrics,
Vol. 14,
Issue. 1-4,
p.
201.
Toraya, H.
and
Yoshino, J.
1997.
Advances in X-Ray Analysis.
p.
165.
Madsen, Lynnette D.
and
Weaver, Louise
1998.
Characterization of Lead Oxide Thin Films Produced by Chemical Vapor Deposition.
Journal of the American Ceramic Society,
Vol. 81,
Issue. 4,
p.
988.
Rodriguez, Mark A.
Boyle, Timothy J.
Hernandez, Bernadette A.
Tallant, David R.
and
Vanheusden, Karel
1999.
A New Metastable Thin‐Film Strontium Tantalate Perovskite.
Journal of the American Ceramic Society,
Vol. 82,
Issue. 8,
p.
2101.