Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-01-08T21:59:19.423Z Has data issue: false hasContentIssue false

A. von Davier, P.W. Holland, and D.T. Thayer (2004). The kernel method of test equating. New York: Springer-Verlag. 229+xxii pages. $69.95.

Review products

A. von Davier, P.W. Holland, and D.T. Thayer (2004). The kernel method of test equating. New York: Springer-Verlag. 229+xxii pages. $69.95.

Published online by Cambridge University Press:  01 January 2025

Michael J. Kolen*
Affiliation:
The University of Iowa

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Book Review
Copyright
Copyright © 2006 The Psychometric Society

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Holland, P.W., & Rubin, D.B. (1982). Test equating, New York: Academic Press.Google Scholar
Holland, P.W., & Thayer, D.T. (1987). Notes on the use of log-linear models for fitting discrete probability distributions, (Technical Report 87–79). Princeton, NJ: Educational Testing Service.CrossRefGoogle Scholar
Holland, P.W., & Thayer, D.T. (1989). The kernel method of equating score distributions, (Technical Report 89-84). Princeton, NJ: Educational Testing Service.CrossRefGoogle Scholar